Lightning-Induced Voltages in the Presence of Nearby Buildings: FDTD Simulation Versus Small-Scale Experiment
In this paper, we have computed lightning-induced voltages on overhead distribution lines in the presence of nearby buildings using the 3-D finite-difference time-domain method. In the simulations, four-conductor lines with surge arresters and pole transformers are considered. It appears that the pr...
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| Veröffentlicht in: | IEEE transactions on electromagnetic compatibility 2015-12, Vol.57 (6), p.1601-1607 |
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| container_title | IEEE transactions on electromagnetic compatibility |
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| creator | Tran Huu Thang Baba, Yoshihiro Piantini, Alexandre Rakov, Vladimir A. |
| description | In this paper, we have computed lightning-induced voltages on overhead distribution lines in the presence of nearby buildings using the 3-D finite-difference time-domain method. In the simulations, four-conductor lines with surge arresters and pole transformers are considered. It appears that the presence of nearby buildings causes reduction of lightning induced voltages, as expected. The observed trend is in general agreement with that reported from the small-scale experiment by Piantini et al. |
| doi_str_mv | 10.1109/TEMC.2015.2457951 |
| format | Article |
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In the simulations, four-conductor lines with surge arresters and pole transformers are considered. It appears that the presence of nearby buildings causes reduction of lightning induced voltages, as expected. The observed trend is in general agreement with that reported from the small-scale experiment by Piantini et al.</description><identifier>ISSN: 0018-9375</identifier><identifier>EISSN: 1558-187X</identifier><identifier>DOI: 10.1109/TEMC.2015.2457951</identifier><identifier>CODEN: IEMCAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Arresters ; Buildings ; Computer simulation ; Conductors ; Electric potential ; Electromagnetic compatibility ; Finite difference method ; Finite difference methods ; Finite-difference time-domain (FDTD) method ; Lightning ; lightning-induced voltage ; shielding effect of nearby buildings ; Small scale ; subgrid model ; Surges ; Voltage ; Voltage measurement</subject><ispartof>IEEE transactions on electromagnetic compatibility, 2015-12, Vol.57 (6), p.1601-1607</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2015</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c440t-962cf001ed6827f5cd4cfa99ff5bfd80df39c2b9edd09487fb6c88f6dd7d756c3</citedby><cites>FETCH-LOGICAL-c440t-962cf001ed6827f5cd4cfa99ff5bfd80df39c2b9edd09487fb6c88f6dd7d756c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7174541$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7174541$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Tran Huu Thang</creatorcontrib><creatorcontrib>Baba, Yoshihiro</creatorcontrib><creatorcontrib>Piantini, Alexandre</creatorcontrib><creatorcontrib>Rakov, Vladimir A.</creatorcontrib><title>Lightning-Induced Voltages in the Presence of Nearby Buildings: FDTD Simulation Versus Small-Scale Experiment</title><title>IEEE transactions on electromagnetic compatibility</title><addtitle>TEMC</addtitle><description>In this paper, we have computed lightning-induced voltages on overhead distribution lines in the presence of nearby buildings using the 3-D finite-difference time-domain method. In the simulations, four-conductor lines with surge arresters and pole transformers are considered. It appears that the presence of nearby buildings causes reduction of lightning induced voltages, as expected. The observed trend is in general agreement with that reported from the small-scale experiment by Piantini et al.</description><subject>Arresters</subject><subject>Buildings</subject><subject>Computer simulation</subject><subject>Conductors</subject><subject>Electric potential</subject><subject>Electromagnetic compatibility</subject><subject>Finite difference method</subject><subject>Finite difference methods</subject><subject>Finite-difference time-domain (FDTD) method</subject><subject>Lightning</subject><subject>lightning-induced voltage</subject><subject>shielding effect of nearby buildings</subject><subject>Small scale</subject><subject>subgrid model</subject><subject>Surges</subject><subject>Voltage</subject><subject>Voltage measurement</subject><issn>0018-9375</issn><issn>1558-187X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkcFqGzEQhkVooW6aByi9CHLpZR1pV1pJvaWO0wbcNmA35LbI0shR0GodaReSt6-MQw49DQPfP_zDh9BnSuaUEnWxWf5azGtC-bxmXChOT9CMci4rKsX9OzQjhMpKNYJ_QB9zfiwr43UzQ_3K7x7G6OOuuol2MmDx3RBGvYOMfcTjA-DbBBmiATw4_Bt02r7g75MPtmTyN3x9tbnCa99PQY9-iPgOUp4yXvc6hGptdAC8fN5D8j3E8RN673TIcPY6T9Hf6-Vm8bNa_flxs7hcVYYxMlaqrY0rFcG2shaOG8uM00o5x7fOSmJdo0y9VWAtUUwKt22NlK61VljBW9Ocoq_Hu_s0PE2Qx6732UAIOsIw5Y4K1dSsYaIt6Pl_6OMwpVjaFYoTInnLZKHokTJpyDmB6_blI51eOkq6g4DuIKA7COheBZTMl2PGA8AbL6hgnNHmH0RygoQ</recordid><startdate>20151201</startdate><enddate>20151201</enddate><creator>Tran Huu Thang</creator><creator>Baba, Yoshihiro</creator><creator>Piantini, Alexandre</creator><creator>Rakov, Vladimir A.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20151201</creationdate><title>Lightning-Induced Voltages in the Presence of Nearby Buildings: FDTD Simulation Versus Small-Scale Experiment</title><author>Tran Huu Thang ; Baba, Yoshihiro ; Piantini, Alexandre ; Rakov, Vladimir A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c440t-962cf001ed6827f5cd4cfa99ff5bfd80df39c2b9edd09487fb6c88f6dd7d756c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Arresters</topic><topic>Buildings</topic><topic>Computer simulation</topic><topic>Conductors</topic><topic>Electric potential</topic><topic>Electromagnetic compatibility</topic><topic>Finite difference method</topic><topic>Finite difference methods</topic><topic>Finite-difference time-domain (FDTD) method</topic><topic>Lightning</topic><topic>lightning-induced voltage</topic><topic>shielding effect of nearby buildings</topic><topic>Small scale</topic><topic>subgrid model</topic><topic>Surges</topic><topic>Voltage</topic><topic>Voltage measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tran Huu Thang</creatorcontrib><creatorcontrib>Baba, Yoshihiro</creatorcontrib><creatorcontrib>Piantini, Alexandre</creatorcontrib><creatorcontrib>Rakov, Vladimir A.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on electromagnetic compatibility</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Tran Huu Thang</au><au>Baba, Yoshihiro</au><au>Piantini, Alexandre</au><au>Rakov, Vladimir A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Lightning-Induced Voltages in the Presence of Nearby Buildings: FDTD Simulation Versus Small-Scale Experiment</atitle><jtitle>IEEE transactions on electromagnetic compatibility</jtitle><stitle>TEMC</stitle><date>2015-12-01</date><risdate>2015</risdate><volume>57</volume><issue>6</issue><spage>1601</spage><epage>1607</epage><pages>1601-1607</pages><issn>0018-9375</issn><eissn>1558-187X</eissn><coden>IEMCAE</coden><abstract>In this paper, we have computed lightning-induced voltages on overhead distribution lines in the presence of nearby buildings using the 3-D finite-difference time-domain method. In the simulations, four-conductor lines with surge arresters and pole transformers are considered. It appears that the presence of nearby buildings causes reduction of lightning induced voltages, as expected. The observed trend is in general agreement with that reported from the small-scale experiment by Piantini et al.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TEMC.2015.2457951</doi><tpages>7</tpages></addata></record> |
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| ispartof | IEEE transactions on electromagnetic compatibility, 2015-12, Vol.57 (6), p.1601-1607 |
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| subjects | Arresters Buildings Computer simulation Conductors Electric potential Electromagnetic compatibility Finite difference method Finite difference methods Finite-difference time-domain (FDTD) method Lightning lightning-induced voltage shielding effect of nearby buildings Small scale subgrid model Surges Voltage Voltage measurement |
| title | Lightning-Induced Voltages in the Presence of Nearby Buildings: FDTD Simulation Versus Small-Scale Experiment |
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