Microscopic magnetization structures and noise in single-layer perpendicular thin film media

A new method to evaluate microscopic magnetization intensities has been developed based on a magnetic force microscopy (MFM) observation. The MFM tip-to-sample distance is varied to get quantitative information at the magnetic layer surface. The method is applied to investigate the origin of medium...

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Veröffentlicht in:	IEEE transactions on magnetics 1998-07, Vol.34 (4), p.1633-1635
Hauptverfasser:	Honda, Y., Hirayama, Y., Ito, K., Futamoto, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic force microscopy Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Magnetic force microscopy Magnetic forces Magnetic heads Magnetic noise Magnetic properties and materials Magnetic recording Magnetic recording materials Magnetization Perpendicular magnetic recording Physics Studies of specific magnetic materials Thermal force Transistors
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Beschreibung
Zusammenfassung:	A new method to evaluate microscopic magnetization intensities has been developed based on a magnetic force microscopy (MFM) observation. The MFM tip-to-sample distance is varied to get quantitative information at the magnetic layer surface. The method is applied to investigate the origin of medium noise in single-layer perpendicular media. The irregular magnetization in the DC erased state and the average size of magnetization irregularities are quantitatively evaluated for CoCr-alloy perpendicular media with different noise characteristics.
ISSN:	0018-9464 1941-0069
DOI:	10.1109/20.706639