FMR and magnetization study of NiFe/Ag/CoNi trilayer film
The polycrystalline FeNi/Ag/CoNi asymmetric trilayer films were prepared by UHV magnetron sputtering on silicon. In plane magnetization measurements showed double-step hysteresis loops. Magnetoresistance (MR) measurements revealed a giant magnetoresistance effect with magnitudes in the 0.15-0.29% ra...
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| Veröffentlicht in: | IEEE transactions on magnetics 1998-07, Vol.34 (4), p.846-848 |
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| container_title | IEEE transactions on magnetics |
| container_volume | 34 |
| creator | Koymen, A.R. Tagirov, L.R. Gilmutdinov, R.T. Topacli, C. Birlikseven, C. Durusoy, H.Z. Aktas, B. |
| description | The polycrystalline FeNi/Ag/CoNi asymmetric trilayer films were prepared by UHV magnetron sputtering on silicon. In plane magnetization measurements showed double-step hysteresis loops. Magnetoresistance (MR) measurements revealed a giant magnetoresistance effect with magnitudes in the 0.15-0.29% range at room temperature. The saturation magnetizations and the interaction between layers were studied by ferromagnetic resonance and revealed an undistinguishably weak interlayer coupling from out-of-plane geometry of measurements. The MR data are interpreted based on the incomplete domain alignment model for polycrystalline magnetic films. |
| doi_str_mv | 10.1109/20.706282 |
| format | Article |
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In plane magnetization measurements showed double-step hysteresis loops. Magnetoresistance (MR) measurements revealed a giant magnetoresistance effect with magnitudes in the 0.15-0.29% range at room temperature. The saturation magnetizations and the interaction between layers were studied by ferromagnetic resonance and revealed an undistinguishably weak interlayer coupling from out-of-plane geometry of measurements. The MR data are interpreted based on the incomplete domain alignment model for polycrystalline magnetic films.</description><subject>Couplings</subject><subject>Geometry</subject><subject>Giant magnetoresistance</subject><subject>Magnetic hysteresis</subject><subject>Magnetic resonance</subject><subject>Saturation magnetization</subject><subject>Semiconductor films</subject><subject>Silicon</subject><subject>Sputtering</subject><subject>Temperature distribution</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1998</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqN0E1LAzEQBuAgCtbqwaunnAQP206ySXZzLMWqUCuInkN2d1Ii-1GT7aH--q5s8expGObhZXgJuWUwYwz0nMMsA8VzfkYmTAuWACh9TiYALE-0UOKSXMX4NaxCMpgQvXp9p7ataGO3Lfb-x_a-a2ns99WBdo5u_Arni-182W087YOv7QEDdb5ursmFs3XEm9Ocks_V48fyOVm_Pb0sF-ukTCHvE6Ww0ilIKArHlBLaZhJSlXIoEFyVY1YUCirHOWMSFCudtGUpCymrVArt0im5H3N3ofveY-xN42OJdW1b7PbR8DzjIBT7B-TDI0oM8GGEZehiDOjMLvjGhoNhYH5bNBzM2OJg70brEfHPnY5HrGNqFA</recordid><startdate>19980701</startdate><enddate>19980701</enddate><creator>Koymen, A.R.</creator><creator>Tagirov, L.R.</creator><creator>Gilmutdinov, R.T.</creator><creator>Topacli, C.</creator><creator>Birlikseven, C.</creator><creator>Durusoy, H.Z.</creator><creator>Aktas, B.</creator><general>IEEE</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>8BQ</scope><scope>JG9</scope></search><sort><creationdate>19980701</creationdate><title>FMR and magnetization study of NiFe/Ag/CoNi trilayer film</title><author>Koymen, A.R. ; Tagirov, L.R. ; Gilmutdinov, R.T. ; Topacli, C. ; Birlikseven, C. ; Durusoy, H.Z. ; Aktas, B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c308t-66ed93050bbf16649a75036320be0fd8e7bb60df22115061cf5acc5b55d3549f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Couplings</topic><topic>Geometry</topic><topic>Giant magnetoresistance</topic><topic>Magnetic hysteresis</topic><topic>Magnetic resonance</topic><topic>Saturation magnetization</topic><topic>Semiconductor films</topic><topic>Silicon</topic><topic>Sputtering</topic><topic>Temperature distribution</topic><toplevel>online_resources</toplevel><creatorcontrib>Koymen, A.R.</creatorcontrib><creatorcontrib>Tagirov, L.R.</creatorcontrib><creatorcontrib>Gilmutdinov, R.T.</creatorcontrib><creatorcontrib>Topacli, C.</creatorcontrib><creatorcontrib>Birlikseven, C.</creatorcontrib><creatorcontrib>Durusoy, H.Z.</creatorcontrib><creatorcontrib>Aktas, B.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>METADEX</collection><collection>Materials Research Database</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Koymen, A.R.</au><au>Tagirov, L.R.</au><au>Gilmutdinov, R.T.</au><au>Topacli, C.</au><au>Birlikseven, C.</au><au>Durusoy, H.Z.</au><au>Aktas, B.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>FMR and magnetization study of NiFe/Ag/CoNi trilayer film</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>1998-07-01</date><risdate>1998</risdate><volume>34</volume><issue>4</issue><spage>846</spage><epage>848</epage><pages>846-848</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>The polycrystalline FeNi/Ag/CoNi asymmetric trilayer films were prepared by UHV magnetron sputtering on silicon. In plane magnetization measurements showed double-step hysteresis loops. Magnetoresistance (MR) measurements revealed a giant magnetoresistance effect with magnitudes in the 0.15-0.29% range at room temperature. The saturation magnetizations and the interaction between layers were studied by ferromagnetic resonance and revealed an undistinguishably weak interlayer coupling from out-of-plane geometry of measurements. The MR data are interpreted based on the incomplete domain alignment model for polycrystalline magnetic films.</abstract><pub>IEEE</pub><doi>10.1109/20.706282</doi><tpages>3</tpages></addata></record> |
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| ispartof | IEEE transactions on magnetics, 1998-07, Vol.34 (4), p.846-848 |
| issn | 0018-9464 1941-0069 |
| language | eng |
| recordid | cdi_ieee_primary_706282 |
| source | IEEE Electronic Library (IEL) |
| subjects | Couplings Geometry Giant magnetoresistance Magnetic hysteresis Magnetic resonance Saturation magnetization Semiconductor films Silicon Sputtering Temperature distribution |
| title | FMR and magnetization study of NiFe/Ag/CoNi trilayer film |
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