GaN-Based LEDs With Al-Doped ZnO Transparent Conductive Layer Grown by Metal Organic Chemical Vapor Deposition: Ultralow Forward Voltage and Highly Uniformity
In this letter, InGaN/GaN multiquantum well LEDs were fabricated with aluminum-doped zinc oxide (AZO) transparent conductive layer (TCL) grown by metal organic chemical vapor deposition (MOCVD) on n + -InGaN contact layer. Ultralow forward voltage (V f ) of 2.86 V at 20 mA was obtained, attributing...
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Veröffentlicht in: | IEEE electron device letters 2015-04, Vol.36 (4), p.372-374 |
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Sprache: | eng |
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Zusammenfassung: | In this letter, InGaN/GaN multiquantum well LEDs were fabricated with aluminum-doped zinc oxide (AZO) transparent conductive layer (TCL) grown by metal organic chemical vapor deposition (MOCVD) on n + -InGaN contact layer. Ultralow forward voltage (V f ) of 2.86 V at 20 mA was obtained, attributing to the epitaxial-like excellent interface between AZO/n + -InGaN contact layer confirmed by high-resolution transmission electron microscopy. The most worthy is that the V f uniformity can be demonstrated on a 2-in wafer with a standard deviation of 0.02 V. Combined with the excellent light extraction, the MOCVD grown AZO-TCL is expected to be an alternative of tin-doped indium oxide in GaN-based LEDs for mass production. |
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ISSN: | 0741-3106 1558-0563 |
DOI: | 10.1109/LED.2015.2404137 |