Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor

A calculable capacitor links the U.S. capacitance unit to the SI unit and has a relative standard uncertainty of 2/spl times/10/sup -8/. Geometrical imperfections are one of the largest sources of this uncertainty. Tests with a model calculable capacitor have been done to better evaluate and reduce...

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Hauptverfasser:	Jeffery, A., Lee, L.H., Shields, J.Q.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Bars Capacitance Capacitors Electrodes Length measurement NIST Position measurement Probes Solid modeling Testing
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container_start_page	454
container_title
container_volume
creator	Jeffery, A. Lee, L.H. Shields, J.Q.
description	A calculable capacitor links the U.S. capacitance unit to the SI unit and has a relative standard uncertainty of 2/spl times/10/sup -8/. Geometrical imperfections are one of the largest sources of this uncertainty. Tests with a model calculable capacitor have been done to better evaluate and reduce this uncertainty.
doi_str_mv	10.1109/CPEM.1998.700000
format	Conference Proceeding
fullrecord	<record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_700000</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>700000</ieee_id><sourcerecordid>700000</sourcerecordid><originalsourceid>FETCH-LOGICAL-i146t-7243831af99c937d55854d561166ac09a5a5b3905b2c928030fedb8ecf765ed3</originalsourceid><addsrcrecordid>eNotkEFLxDAQhQMiqOvexVP-QGvSNG1ylLLqwq4K9r6kyWSNtE1pouC_N911LvN43_DgDUJ3lOSUEvnQvG_2OZVS5DVZ5gLdkFoQxgkV8gqtQ_ha7JJzWohrZPbeQI8jhBhw9NiNP0m6o4qA4ydgsBZ0Qt7iI_gB4uy06rEbJpgX4vyY4Hi6fd1-tDhR_d2rrockJ6Vd9PMturSqD7D-3yvUPm3a5iXbvT1vm8dd5mhZxawuSiYYVVZKLVltOBe8NLyitKqUJlJxxTsmCe8KLYvUiVgwnQBt64qDYSt0f451AHCYZjeo-fdwfgP7A77YU9U</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Jeffery, A. ; Lee, L.H. ; Shields, J.Q.</creator><creatorcontrib>Jeffery, A. ; Lee, L.H. ; Shields, J.Q.</creatorcontrib><description>A calculable capacitor links the U.S. capacitance unit to the SI unit and has a relative standard uncertainty of 2/spl times/10/sup -8/. Geometrical imperfections are one of the largest sources of this uncertainty. Tests with a model calculable capacitor have been done to better evaluate and reduce this uncertainty.</description><identifier>ISBN: 0780350189</identifier><identifier>ISBN: 9780780350182</identifier><identifier>DOI: 10.1109/CPEM.1998.700000</identifier><language>eng</language><publisher>IEEE</publisher><subject>Bars ; Capacitance ; Capacitors ; Electrodes ; Length measurement ; NIST ; Position measurement ; Probes ; Solid modeling ; Testing</subject><ispartof>1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254), 1998, p.454-455</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/700000$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/700000$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Jeffery, A.</creatorcontrib><creatorcontrib>Lee, L.H.</creatorcontrib><creatorcontrib>Shields, J.Q.</creatorcontrib><title>Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor</title><title>1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)</title><addtitle>CPEM</addtitle><description>A calculable capacitor links the U.S. capacitance unit to the SI unit and has a relative standard uncertainty of 2/spl times/10/sup -8/. Geometrical imperfections are one of the largest sources of this uncertainty. Tests with a model calculable capacitor have been done to better evaluate and reduce this uncertainty.</description><subject>Bars</subject><subject>Capacitance</subject><subject>Capacitors</subject><subject>Electrodes</subject><subject>Length measurement</subject><subject>NIST</subject><subject>Position measurement</subject><subject>Probes</subject><subject>Solid modeling</subject><subject>Testing</subject><isbn>0780350189</isbn><isbn>9780780350182</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1998</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotkEFLxDAQhQMiqOvexVP-QGvSNG1ylLLqwq4K9r6kyWSNtE1pouC_N911LvN43_DgDUJ3lOSUEvnQvG_2OZVS5DVZ5gLdkFoQxgkV8gqtQ_ha7JJzWohrZPbeQI8jhBhw9NiNP0m6o4qA4ydgsBZ0Qt7iI_gB4uy06rEbJpgX4vyY4Hi6fd1-tDhR_d2rrockJ6Vd9PMturSqD7D-3yvUPm3a5iXbvT1vm8dd5mhZxawuSiYYVVZKLVltOBe8NLyitKqUJlJxxTsmCe8KLYvUiVgwnQBt64qDYSt0f451AHCYZjeo-fdwfgP7A77YU9U</recordid><startdate>1998</startdate><enddate>1998</enddate><creator>Jeffery, A.</creator><creator>Lee, L.H.</creator><creator>Shields, J.Q.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>1998</creationdate><title>Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor</title><author>Jeffery, A. ; Lee, L.H. ; Shields, J.Q.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i146t-7243831af99c937d55854d561166ac09a5a5b3905b2c928030fedb8ecf765ed3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1998</creationdate><topic>Bars</topic><topic>Capacitance</topic><topic>Capacitors</topic><topic>Electrodes</topic><topic>Length measurement</topic><topic>NIST</topic><topic>Position measurement</topic><topic>Probes</topic><topic>Solid modeling</topic><topic>Testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Jeffery, A.</creatorcontrib><creatorcontrib>Lee, L.H.</creatorcontrib><creatorcontrib>Shields, J.Q.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library Online</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jeffery, A.</au><au>Lee, L.H.</au><au>Shields, J.Q.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor</atitle><btitle>1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254)</btitle><stitle>CPEM</stitle><date>1998</date><risdate>1998</risdate><spage>454</spage><epage>455</epage><pages>454-455</pages><isbn>0780350189</isbn><isbn>9780780350182</isbn><abstract>A calculable capacitor links the U.S. capacitance unit to the SI unit and has a relative standard uncertainty of 2/spl times/10/sup -8/. Geometrical imperfections are one of the largest sources of this uncertainty. Tests with a model calculable capacitor have been done to better evaluate and reduce this uncertainty.</abstract><pub>IEEE</pub><doi>10.1109/CPEM.1998.700000</doi><tpages>2</tpages><oa>free_for_read</oa></addata></record>
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identifier	ISBN: 0780350189
ispartof	1998 Conference on Precision Electromagnetic Measurements Digest (Cat. No.98CH36254), 1998, p.454-455
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source	IEEE Electronic Library (IEL) Conference Proceedings
subjects	Bars Capacitance Capacitors Electrodes Length measurement NIST Position measurement Probes Solid modeling Testing
title	Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T05%3A52%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Model%20tests%20to%20investigate%20the%20effects%20of%20geometrical%20imperfections%20on%20the%20NIST%20calculable%20capacitor&rft.btitle=1998%20Conference%20on%20Precision%20Electromagnetic%20Measurements%20Digest%20(Cat.%20No.98CH36254)&rft.au=Jeffery,%20A.&rft.date=1998&rft.spage=454&rft.epage=455&rft.pages=454-455&rft.isbn=0780350189&rft.isbn_list=9780780350182&rft_id=info:doi/10.1109/CPEM.1998.700000&rft_dat=%3Cieee_6IE%3E700000%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=700000&rfr_iscdi=true