Model tests to investigate the effects of geometrical imperfections on the NIST calculable capacitor
A calculable capacitor links the U.S. capacitance unit to the SI unit and has a relative standard uncertainty of 2/spl times/10/sup -8/. Geometrical imperfections are one of the largest sources of this uncertainty. Tests with a model calculable capacitor have been done to better evaluate and reduce...
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Format: | Tagungsbericht |
Sprache: | eng |
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Zusammenfassung: | A calculable capacitor links the U.S. capacitance unit to the SI unit and has a relative standard uncertainty of 2/spl times/10/sup -8/. Geometrical imperfections are one of the largest sources of this uncertainty. Tests with a model calculable capacitor have been done to better evaluate and reduce this uncertainty. |
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DOI: | 10.1109/CPEM.1998.700000 |