Chip scale packaging for memory devices

A low cost, high reliability chip scale package has been developed for memory devices. The developed CSP can be applied to center pad type devices such as DRAM and to peripheral pad type devices such as SRAM and Flash. Reliability and high volume productivity are the main technological challenges th...

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Bibliographische Detailangaben
Hauptverfasser: Akiyama, Y., Nishimura, A., Anjoh, I.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:A low cost, high reliability chip scale package has been developed for memory devices. The developed CSP can be applied to center pad type devices such as DRAM and to peripheral pad type devices such as SRAM and Flash. Reliability and high volume productivity are the main technological challenges that have to be overcome for chip scale packaging. This paper unveils Hitachi's original CSP concept and shows how our CSP overcomes these challenges.
ISSN:0569-5503
2377-5726
DOI:10.1109/ECTC.1998.678737