2.1 28Gb/s 560mW multi-standard SerDes with single-stage analog front-end and 14-tap decision-feedback equalizer in 28nm CMOS

A high-speed SerDes must meet multiple challenges including high-speed operation, intensive equalization technique, low power consumption, small area and robustness. In order to meet new standards, such a OIF CEI-25G-LR, CEI-28G-MR/SR/VSR, IEEE802.3bj and 32G-FC, data-rates are increased to 25 to 28Gb/s, which is more than 75% higher than the previous generation of SerDes. For SerDes applications with several hundreds of lanes integrated in single chip, power consumption is very important factor while maintaining high performance. There are several previous works at 28Gb/s or higher data-rate [1-2]. They use an unrolled DFE to meet the critical timing margin, but the unrolled DFE structure increases the number of DFE slicers, increasing the overall power and die area. In order to tackle these challenges, we introduce several circuits and architectural techniques. The analog front-end (AFE) uses a single-stage architecture and a compact on-chip passive inductor in the transimpedance amplifier (TIA), providing 15dB boost. The boost is adaptive and its adaptation loop is decoupled from the decision-feedback equalizer (DFE) adaptation loop by the use of a group-delay adaptation (GDA) algorithm. DFE has a half-rate 1-tap unrolled structure with 2 total error latches for power and area reduction. A two-stage sense-amplifier-based slicer achieves a sensitivity of 15mV and DFE timing closure. We also develop a high-speed clock buffer that uses a new active-inductor circuit. This active-inductor circuit has the capability to control output-common-mode voltage to optimize circuit operating points.