Double position-signal-difference method for electric near-field measurements

A position/signal difference method for electric near-field measurements has been investigated and extended to a double position/signal difference method in order to independently extract the normal and tangential electric near-field components using two measurements at slightly different heights above the test object. A printed monopole probe was fabricated and used for electric near-field measurements above a microstrip line using the proposed method. In addition, full-wave electromagnetic simulations were carried out and the measured normal and tangential components were found to be in good agreement with the simulation results at 1 GHz.