Wavelet transform domain adaptive clustering for electronic product quality inspection

Wavelet transform domain adaptive clustering for electronic product quality inspection

Wavelet transform (WT) domain adaptive clustering for electronic product quality inspection was suggested in this work. The proposed information technology, based on the multistart adaptive clustering method in the space of the WT, can shorten manufacturing test of products in case of a significant...

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Bibliographische Detailangaben
Hauptverfasser: Shcherbakova, Galina, Krylov, Viktor, Pisarenko, Radmila, Kuzmenko, Vadym
Format: Tagungsbericht
Sprache:eng
Schlagworte:
clustering
Clustering methods
Manufacturing
Noise
Parameter estimation
Resistors
sub gradient
Time measurement
wavelet transfor domain
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Beschreibung
Zusammenfassung:Wavelet transform (WT) domain adaptive clustering for electronic product quality inspection was suggested in this work. The proposed information technology, based on the multistart adaptive clustering method in the space of the WT, can shorten manufacturing test of products in case of a significant change in these parameters over time, a high noise level and small samples of data.
DOI:10.1109/IDAACS.2013.6662660