Approaches of voltage divider development for metrology verification of ADC
It is presented the method of testing signal generation for ADC's integral nonlinearity identification in testing point using measurement converter based on multi-resistors voltage divider with averaging voltages of all resistors. It is proved that such converter is insensitive to resistances a...
Gespeichert in:
| Hauptverfasser: | , , , , |
|---|---|
| Format: | Tagungsbericht |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 75 |
|---|---|
| container_issue | |
| container_start_page | 70 |
| container_title | |
| container_volume | 1 |
| creator | Kochan, Roman Kochan, Orest Chyrka, Mykhaylo Su Jun Bykovyy, Pavlo |
| description | It is presented the method of testing signal generation for ADC's integral nonlinearity identification in testing point using measurement converter based on multi-resistors voltage divider with averaging voltages of all resistors. It is proved that such converter is insensitive to resistances and systematic errors of own resistors. There is evaluated error of ADC's nonlinearity identification, which is caused by changing the curvature of ADC's conversion function in the neighborhood of testing point. Also it is proposed method of number of testing point incrementing - "basic" method, and it is proposed the methodology of development such methods of testing points generation, which provides more evenly distribution of testing points via the range in comparison with "basic" method. |
| doi_str_mv | 10.1109/IDAACS.2013.6662642 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_6662642</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6662642</ieee_id><sourcerecordid>6662642</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-eb771d7381f3cba84b0ba919a5a536973036206ec9be704021b88c3f9b7634373</originalsourceid><addsrcrecordid>eNo1j8tqwzAUBVVKoW3qL8hGP2BXL-taS-P0ERrootkHyb5KVezIyMaQvy-lyeowixk4hKw5Kzhn5nm7qevmqxCMy0JrLbQSN-SRKzCGKwHqlmQGqivr8p5k0_TDGOMAZSn4A_moxzFF237jRKOnS-xne0TahSV0mGiHC_ZxHPA0Ux8THXBOsY_HM10wBR9aO4d4-jPrTfNE7rztJ8wuuyL715d9857vPt-2Tb3Lg2Fzjg6AdyAr7mXrbKUcc9ZwY0tbSm1AMqkF09gah8AUE9xVVSu9caClkiBXZP2fDYh4GFMYbDofLvflL_uRTjE</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Approaches of voltage divider development for metrology verification of ADC</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Kochan, Roman ; Kochan, Orest ; Chyrka, Mykhaylo ; Su Jun ; Bykovyy, Pavlo</creator><creatorcontrib>Kochan, Roman ; Kochan, Orest ; Chyrka, Mykhaylo ; Su Jun ; Bykovyy, Pavlo</creatorcontrib><description>It is presented the method of testing signal generation for ADC's integral nonlinearity identification in testing point using measurement converter based on multi-resistors voltage divider with averaging voltages of all resistors. It is proved that such converter is insensitive to resistances and systematic errors of own resistors. There is evaluated error of ADC's nonlinearity identification, which is caused by changing the curvature of ADC's conversion function in the neighborhood of testing point. Also it is proposed method of number of testing point incrementing - "basic" method, and it is proposed the methodology of development such methods of testing points generation, which provides more evenly distribution of testing points via the range in comparison with "basic" method.</description><identifier>ISBN: 9781479914265</identifier><identifier>ISBN: 1479914266</identifier><identifier>EISBN: 1479914274</identifier><identifier>EISBN: 1479914290</identifier><identifier>EISBN: 9781479914296</identifier><identifier>EISBN: 9781479914272</identifier><identifier>DOI: 10.1109/IDAACS.2013.6662642</identifier><language>eng</language><publisher>IEEE</publisher><subject>analog to digital converter ; Calibration ; Instruments ; integral nonlinearity identification ; Metrology ; Resistors ; Testing ; testing points generation ; Voltage measurement</subject><ispartof>2013 IEEE 7th International Conference on Intelligent Data Acquisition and Advanced Computing Systems (IDAACS), 2013, Vol.1, p.70-75</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6662642$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6662642$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kochan, Roman</creatorcontrib><creatorcontrib>Kochan, Orest</creatorcontrib><creatorcontrib>Chyrka, Mykhaylo</creatorcontrib><creatorcontrib>Su Jun</creatorcontrib><creatorcontrib>Bykovyy, Pavlo</creatorcontrib><title>Approaches of voltage divider development for metrology verification of ADC</title><title>2013 IEEE 7th International Conference on Intelligent Data Acquisition and Advanced Computing Systems (IDAACS)</title><addtitle>IDAACS</addtitle><description>It is presented the method of testing signal generation for ADC's integral nonlinearity identification in testing point using measurement converter based on multi-resistors voltage divider with averaging voltages of all resistors. It is proved that such converter is insensitive to resistances and systematic errors of own resistors. There is evaluated error of ADC's nonlinearity identification, which is caused by changing the curvature of ADC's conversion function in the neighborhood of testing point. Also it is proposed method of number of testing point incrementing - "basic" method, and it is proposed the methodology of development such methods of testing points generation, which provides more evenly distribution of testing points via the range in comparison with "basic" method.</description><subject>analog to digital converter</subject><subject>Calibration</subject><subject>Instruments</subject><subject>integral nonlinearity identification</subject><subject>Metrology</subject><subject>Resistors</subject><subject>Testing</subject><subject>testing points generation</subject><subject>Voltage measurement</subject><isbn>9781479914265</isbn><isbn>1479914266</isbn><isbn>1479914274</isbn><isbn>1479914290</isbn><isbn>9781479914296</isbn><isbn>9781479914272</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2013</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo1j8tqwzAUBVVKoW3qL8hGP2BXL-taS-P0ERrootkHyb5KVezIyMaQvy-lyeowixk4hKw5Kzhn5nm7qevmqxCMy0JrLbQSN-SRKzCGKwHqlmQGqivr8p5k0_TDGOMAZSn4A_moxzFF237jRKOnS-xne0TahSV0mGiHC_ZxHPA0Ux8THXBOsY_HM10wBR9aO4d4-jPrTfNE7rztJ8wuuyL715d9857vPt-2Tb3Lg2Fzjg6AdyAr7mXrbKUcc9ZwY0tbSm1AMqkF09gah8AUE9xVVSu9caClkiBXZP2fDYh4GFMYbDofLvflL_uRTjE</recordid><startdate>201309</startdate><enddate>201309</enddate><creator>Kochan, Roman</creator><creator>Kochan, Orest</creator><creator>Chyrka, Mykhaylo</creator><creator>Su Jun</creator><creator>Bykovyy, Pavlo</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201309</creationdate><title>Approaches of voltage divider development for metrology verification of ADC</title><author>Kochan, Roman ; Kochan, Orest ; Chyrka, Mykhaylo ; Su Jun ; Bykovyy, Pavlo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-eb771d7381f3cba84b0ba919a5a536973036206ec9be704021b88c3f9b7634373</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2013</creationdate><topic>analog to digital converter</topic><topic>Calibration</topic><topic>Instruments</topic><topic>integral nonlinearity identification</topic><topic>Metrology</topic><topic>Resistors</topic><topic>Testing</topic><topic>testing points generation</topic><topic>Voltage measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Kochan, Roman</creatorcontrib><creatorcontrib>Kochan, Orest</creatorcontrib><creatorcontrib>Chyrka, Mykhaylo</creatorcontrib><creatorcontrib>Su Jun</creatorcontrib><creatorcontrib>Bykovyy, Pavlo</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kochan, Roman</au><au>Kochan, Orest</au><au>Chyrka, Mykhaylo</au><au>Su Jun</au><au>Bykovyy, Pavlo</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Approaches of voltage divider development for metrology verification of ADC</atitle><btitle>2013 IEEE 7th International Conference on Intelligent Data Acquisition and Advanced Computing Systems (IDAACS)</btitle><stitle>IDAACS</stitle><date>2013-09</date><risdate>2013</risdate><volume>1</volume><spage>70</spage><epage>75</epage><pages>70-75</pages><isbn>9781479914265</isbn><isbn>1479914266</isbn><eisbn>1479914274</eisbn><eisbn>1479914290</eisbn><eisbn>9781479914296</eisbn><eisbn>9781479914272</eisbn><abstract>It is presented the method of testing signal generation for ADC's integral nonlinearity identification in testing point using measurement converter based on multi-resistors voltage divider with averaging voltages of all resistors. It is proved that such converter is insensitive to resistances and systematic errors of own resistors. There is evaluated error of ADC's nonlinearity identification, which is caused by changing the curvature of ADC's conversion function in the neighborhood of testing point. Also it is proposed method of number of testing point incrementing - "basic" method, and it is proposed the methodology of development such methods of testing points generation, which provides more evenly distribution of testing points via the range in comparison with "basic" method.</abstract><pub>IEEE</pub><doi>10.1109/IDAACS.2013.6662642</doi><tpages>6</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISBN: 9781479914265 |
| ispartof | 2013 IEEE 7th International Conference on Intelligent Data Acquisition and Advanced Computing Systems (IDAACS), 2013, Vol.1, p.70-75 |
| issn | |
| language | eng |
| recordid | cdi_ieee_primary_6662642 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | analog to digital converter Calibration Instruments integral nonlinearity identification Metrology Resistors Testing testing points generation Voltage measurement |
| title | Approaches of voltage divider development for metrology verification of ADC |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T16%3A37%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Approaches%20of%20voltage%20divider%20development%20for%20metrology%20verification%20of%20ADC&rft.btitle=2013%20IEEE%207th%20International%20Conference%20on%20Intelligent%20Data%20Acquisition%20and%20Advanced%20Computing%20Systems%20(IDAACS)&rft.au=Kochan,%20Roman&rft.date=2013-09&rft.volume=1&rft.spage=70&rft.epage=75&rft.pages=70-75&rft.isbn=9781479914265&rft.isbn_list=1479914266&rft_id=info:doi/10.1109/IDAACS.2013.6662642&rft_dat=%3Cieee_6IE%3E6662642%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=1479914274&rft.eisbn_list=1479914290&rft.eisbn_list=9781479914296&rft.eisbn_list=9781479914272&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6662642&rfr_iscdi=true |