Approaches of voltage divider development for metrology verification of ADC

It is presented the method of testing signal generation for ADC's integral nonlinearity identification in testing point using measurement converter based on multi-resistors voltage divider with averaging voltages of all resistors. It is proved that such converter is insensitive to resistances and systematic errors of own resistors. There is evaluated error of ADC's nonlinearity identification, which is caused by changing the curvature of ADC's conversion function in the neighborhood of testing point. Also it is proposed method of number of testing point incrementing - "basic" method, and it is proposed the methodology of development such methods of testing points generation, which provides more evenly distribution of testing points via the range in comparison with "basic" method.