Magnetic microprobe design for EM fault attack

Fault attacks constitute a threat against secure integrated circuits. If they can be conducted by different means, a large attention has recently been paid to the EM side-channel. EM fault attacks are performed through near-field probes. To be efficient, these probes must deliver an intense and loca...

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Bibliographische Detailangaben
Hauptverfasser:	Omarouayache, R., Raoult, J., Jarrix, S., Chusseau, L., Maurine, P.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit faults Electromagnetic compatibility Electromagnetics EM fault attack Ferrites Magnetic fields Magnetic probe Probe design guidelines Probes Radiated field simulations Wires
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Beschreibung
Zusammenfassung:	Fault attacks constitute a threat against secure integrated circuits. If they can be conducted by different means, a large attention has recently been paid to the EM side-channel. EM fault attacks are performed through near-field probes. To be efficient, these probes must deliver an intense and localized field. Using 3-D electromagnetic simulations, this paper proposes guidelines for the design of an efficient magnetic probe excited by a pulse signal.
ISSN:	2325-0356