Numerical and experimental characterization of single- and double-gate race-track-shaped field emitter structures

In this paper, numerical and experimental characterization of new singleand double-gate race-track-shaped field emitter structures are reported. The race-track-shaped edge emission is used to provide good uniformity and large field emission current density, and the double-gate control is used to pro...

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Veröffentlicht in:IEEE transactions on electron devices 1998-02, Vol.45 (2), p.554-559
Hauptverfasser: Baoping Wang, Sin, J.K.O., Jun Cai, Poon, V.M.C., Chen Wang, Yongming Tang, Linsu Tong
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Sprache:eng
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Zusammenfassung:In this paper, numerical and experimental characterization of new singleand double-gate race-track-shaped field emitter structures are reported. The race-track-shaped edge emission is used to provide good uniformity and large field emission current density, and the double-gate control is used to provide small turn-on voltage and minimum gate current. Experimental results show that the turn-on voltage of the single-gate structure is approximately 100 V, and the field emission current density is approximately 2.4 A/cm/sup 2/. Furthermore, field emission characteristics of the single- and double-gate structures are numerically simulated. Results show that turn-on voltage of the double-gate structure is reduced by 30% and ratio of anode current to gate current is increased by 36 times compared to that of the single-gate structure at a gate voltage of 350 V.
ISSN:0018-9383
1557-9646
DOI:10.1109/16.658693