High-power microwave 0.25-μm gate doped-channel GaN/AlGaN heterostructure field effect transistor

We report on the high-power performance of the 0.25-μm gate Doped-Channel GaN/AlGaN Heterostructure Field Effect Transistors (DC-HFETs). At a drain bias voltage of 18 V and drain bias current of 46 mA, these 100-μm wide devices exhibit high gain at 8.4 GHz with a power density reaching 1.73 W/mm. Th...

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Veröffentlicht in:IEEE electron device letters 1998-02, Vol.19 (2), p.44-46
Hauptverfasser: Chen, Q., Yang, J.W., Gaska, R., Khan, M.A., Shur, M.S., Sullivan, G.J., Sailor, A.L., Higgings, J.A., Ping, A.T., Adesida, I.
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Sprache:eng
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Zusammenfassung:We report on the high-power performance of the 0.25-μm gate Doped-Channel GaN/AlGaN Heterostructure Field Effect Transistors (DC-HFETs). At a drain bias voltage of 18 V and drain bias current of 46 mA, these 100-μm wide devices exhibit high gain at 8.4 GHz with a power density reaching 1.73 W/mm. The devices also display high gain at moderate power over a wide range of frequencies. This high gain at high frequency is a result of an optimal doping level in the AlGaN layer that gives rise to a high sheet charge density while maintaining a high-channel electron mobility. These results demonstrate the excellent microwave power capability of the GaN/AlGaN based heterostructure field effect transistors.
ISSN:0741-3106
1558-0563
DOI:10.1109/55.658598