Multi-physics reliability simulation for solid state lighting drivers

This work is introducing a multi-physics reliability simulation approach for solid state lighting (SSL) electronic drivers. The purpose of this simulation is to understand the thermal-electrical behaviour of SSL electronic drivers through their lifetime. Once the behaviour of the device during its lifetime is understood, the real cause of the failure can be distinguished and possibly solved. The work of this paper explores the system-level degradation of SSL drivers by means of applying its components reliability information into a system simulation. Reliability information of the components such as capacitor, inductor, etc. defines how a component electrical behaviour changes with temperature, and also with time.