Test-Fixture for Suspended-Strip Gap-Waveguide Technology on Ka-Band

This letter presents a Test-Fixture for a Suspended-Strip Gap-Waveguide technology that provides a fast measurement system for the prototyping stage. For this purpose, a transition from standard rectangular waveguide to this new technology has been developed. A TRL kit and a repeatability study have...

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Veröffentlicht in:	IEEE microwave and wireless components letters 2013-06, Vol.23 (6), p.321-323
Hauptverfasser:	Gahete Arias, Carlos, Baquero Escudero, Mariano, Valero Nogueira, Alejandro, Vila Jimenez, Antonio
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Circuit properties Circuits Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Metals Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits Microwaves Millimeter-wave Nails New technology Prototyping Rectangular waveguides Repeatability Reproducibility ridge gap-waveguide (RGW) Scattering parameters Strips test-fixture Transmission line measurements
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Beschreibung
Zusammenfassung:	This letter presents a Test-Fixture for a Suspended-Strip Gap-Waveguide technology that provides a fast measurement system for the prototyping stage. For this purpose, a transition from standard rectangular waveguide to this new technology has been developed. A TRL kit and a repeatability study have been made to ensure the reliability of the process, and several straightforward circuits have been manufactured and measured.
ISSN:	1531-1309 2771-957X 1558-1764 2771-9588
DOI:	10.1109/LMWC.2013.2258000