A true differential characterization of a 80 GHz low power wideband receiver chip for microwave imaging application

A true differential characterization of a 80 GHz low power wideband receiver chip for microwave imaging application

In this paper the E-band measurements of compression point and noise figure on a low power wideband receiver chip with differential interfaces are described. In order to give a practical background, some theory and practical aspects for measuring frequency converting differential devices are outline...

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Bibliographische Detailangaben
Hauptverfasser: Zielska, A., Juenemann, R., Schiessl, A., Tiebout, M.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Amplitude modulation
Frequency measurement
Gain measurement
Noise
Noise measurement
Radio frequency
Semiconductor device measurement
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Beschreibung
Zusammenfassung:In this paper the E-band measurements of compression point and noise figure on a low power wideband receiver chip with differential interfaces are described. In order to give a practical background, some theory and practical aspects for measuring frequency converting differential devices are outlined. Measurement setup among with necessary system calibration and measurement results are presented.