Application and analysis of IDDQ diagnostic software

Application and analysis of IDDQ diagnostic software

A current disadvantage of IDDq testing is lack of software-based diagnostic tools that enable IC vendors to create a large database of defects uniquely detected with this test method. We present a methodology for performing defect localization based upon IDDq test information (only). Using this tech...

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Bibliographische Detailangaben
Hauptverfasser: Nigh, P., Forlenza, D., Motika, F.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Application software
Circuit faults
Circuit testing
Failure analysis
Fault detection
Fault diagnosis
Integrated circuit modeling
Integrated circuit testing
Logic testing
Software testing
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Beschreibung
Zusammenfassung:A current disadvantage of IDDq testing is lack of software-based diagnostic tools that enable IC vendors to create a large database of defects uniquely detected with this test method. We present a methodology for performing defect localization based upon IDDq test information (only). Using this technique, fault localization can be completed within minutes (e.g.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.1997.639633