High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies

This paper reports the main contribution of a project devoted to the definition of techniques to design and evaluate fault tolerant systems implemented using the SoPC paradigm, suitable for missionand safety-critical application environments. In particular, the effort of the five involved research u...

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Hauptverfasser: Bolchini, C., Miele, A., Sandionigi, C., Ottavi, M., Pontarelli, S., Salsano, A., Metra, C., Omana, M., Rossi, D., Reorda, M. S., Sterpone, L., Violante, M., Gerardin, S., Bagatin, M., Paccagnella, A.
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:This paper reports the main contribution of a project devoted to the definition of techniques to design and evaluate fault tolerant systems implemented using the SoPC paradigm, suitable for missionand safety-critical application environments. In particular, the effort of the five involved research units has been devoted to address some of the main issues related to the specific technological aspects introduced by these flexible platforms. The overall target of the research is the development of a design methodology for highly reliable systems realized on reconfigurable platforms based on a System-on-Programmable Chip (SoPC), as discussed in the next section.
ISSN:1550-5774
2377-7966
DOI:10.1109/DFT.2012.6378211