SEU, SET, and SEFI Test Results of a Hardened 16Mbit MRAM Device
The SEU, SET, and SEFI heavy ion test results are presented for a 16Mbit MRAM device. The device has been hardened for SEL immunity (≤ 100 MeV·cm 2 /mg) and TID immunity (≤ 1 Mrad(Si)).
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Hauptverfasser: | , , , , |
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Format: | Tagungsbericht |
Sprache: | eng |
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Zusammenfassung: | The SEU, SET, and SEFI heavy ion test results are presented for a 16Mbit MRAM device. The device has been hardened for SEL immunity (≤ 100 MeV·cm 2 /mg) and TID immunity (≤ 1 Mrad(Si)). |
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ISSN: | 2154-0519 2154-0535 |
DOI: | 10.1109/REDW.2012.6353717 |