SEU, SET, and SEFI Test Results of a Hardened 16Mbit MRAM Device

The SEU, SET, and SEFI heavy ion test results are presented for a 16Mbit MRAM device. The device has been hardened for SEL immunity (≤ 100 MeV·cm 2 /mg) and TID immunity (≤ 1 Mrad(Si)).

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Bibliographische Detailangaben
Hauptverfasser: Hafer, C., Von Thun, M., Mundie, M., Bass, D., Sievert, F.
Format: Tagungsbericht
Sprache:eng
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Beschreibung
Zusammenfassung:The SEU, SET, and SEFI heavy ion test results are presented for a 16Mbit MRAM device. The device has been hardened for SEL immunity (≤ 100 MeV·cm 2 /mg) and TID immunity (≤ 1 Mrad(Si)).
ISSN:2154-0519
2154-0535
DOI:10.1109/REDW.2012.6353717