TID in a Mixed-Signal System-on-Chip: Analog Components Analysis and Clock Frequency Influence in Propagation-Delay Degradation

TID in a Mixed-Signal System-on-Chip: Analog Components Analysis and Clock Frequency Influence in Propagation-Delay Degradation

We exposed a mixed-signal system-on-chip to gamma radiation in order to measure variations in current, temperature and propagation-delay in its components, such as configurable array, embedded analog blocks and microprocessor.

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Bibliographische Detailangaben
Hauptverfasser: Tambara, Lucas A., Kastensmidt, Fernanda Lima, C.P.F., Evaldo, Goncalez, Odair L., Balen, Tiago R., de Aguirre, Paulo C.C., Arruego, Ignacio, Lubaszewski, Marcelo S.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Arrays
Degradation
Field programmable gate arrays
Ring oscillators
System-on-a-chip
Temperature measurement
Temperature sensors
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Beschreibung
Zusammenfassung:We exposed a mixed-signal system-on-chip to gamma radiation in order to measure variations in current, temperature and propagation-delay in its components, such as configurable array, embedded analog blocks and microprocessor.
ISSN:2154-0519
2154-0535
DOI:10.1109/REDW.2012.6353710