Characterization of a new 6.5 kV 1000A SiC diode for medium voltage converters
This paper presents a characterization of a new SiC PIN diode module for use in medium voltage converters. It has a rating of 6.5 kV and 1000 A, comparable to Si diodes available nowadays. The static behavior, switching waveforms and losses for the new diode are analyzed. The tests were carried out...
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description | This paper presents a characterization of a new SiC PIN diode module for use in medium voltage converters. It has a rating of 6.5 kV and 1000 A, comparable to Si diodes available nowadays. The static behavior, switching waveforms and losses for the new diode are analyzed. The tests were carried out for currents between 50 and 1000 A. Different dc link voltages (2.4, 3.0 and 3.6 kV), junction temperatures (from -25 to 125°C) and di/dt values (0.9-2.2 kA/μs at 1 kA) were considered for the analysis. The effects and interactions of the different parameters in the device behavior are discussed. |
doi_str_mv | 10.1109/ECCE.2012.6342434 |
format | Conference Proceeding |
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It has a rating of 6.5 kV and 1000 A, comparable to Si diodes available nowadays. The static behavior, switching waveforms and losses for the new diode are analyzed. The tests were carried out for currents between 50 and 1000 A. Different dc link voltages (2.4, 3.0 and 3.6 kV), junction temperatures (from -25 to 125°C) and di/dt values (0.9-2.2 kA/μs at 1 kA) were considered for the analysis. 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It has a rating of 6.5 kV and 1000 A, comparable to Si diodes available nowadays. The static behavior, switching waveforms and losses for the new diode are analyzed. The tests were carried out for currents between 50 and 1000 A. Different dc link voltages (2.4, 3.0 and 3.6 kV), junction temperatures (from -25 to 125°C) and di/dt values (0.9-2.2 kA/μs at 1 kA) were considered for the analysis. The effects and interactions of the different parameters in the device behavior are discussed.</description><subject>Insulated gate bipolar transistors</subject><subject>Junctions</subject><subject>Semiconductor diodes</subject><subject>Silicon carbide</subject><subject>Switches</subject><subject>Temperature measurement</subject><subject>Voltage measurement</subject><issn>2329-3721</issn><issn>2329-3748</issn><isbn>1467308021</isbn><isbn>9781467308021</isbn><isbn>9781467308014</isbn><isbn>1467308013</isbn><isbn>9781467308007</isbn><isbn>9781467308038</isbn><isbn>146730803X</isbn><isbn>1467308005</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2012</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo9kMtOwzAURM1LopR8AGLjH0jw9Y1je1lF5SFVsKBiW93ENhiaBCWhCL6eSBRmM4szOoth7AJEBiDs1bIsl5kUILMCc5ljfsASqw3khUZhBOSHbCZR2hR1bo7Y2R-QcPwPJJyyZBhexRQDBjTO2H35Qj3Vo-_jN42xa3kXOPHWf_IiU_zticO0XvDHWHIXO-d56HreeBc_Gr7rtiM9e1537c73k2M4ZyeBtoNP9j1n6-vlurxNVw83d-VilUYrxhSsFc4qrAqhXK2VDsGgI6VQkhUVVoSirgMRkkanRBW0tFrV2miswAacs8tfbfTeb9772FD_tdk_gz8G7FCZ</recordid><startdate>201209</startdate><enddate>201209</enddate><creator>Filsecker, F.</creator><creator>Alvarez, R.</creator><creator>Bernet, S.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201209</creationdate><title>Characterization of a new 6.5 kV 1000A SiC diode for medium voltage converters</title><author>Filsecker, F. ; Alvarez, R. ; Bernet, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-1990d953b605dc757ff83da5532a90b3ba30ccfaa3a73d50bf72975c7873b19f3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Insulated gate bipolar transistors</topic><topic>Junctions</topic><topic>Semiconductor diodes</topic><topic>Silicon carbide</topic><topic>Switches</topic><topic>Temperature measurement</topic><topic>Voltage measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Filsecker, F.</creatorcontrib><creatorcontrib>Alvarez, R.</creatorcontrib><creatorcontrib>Bernet, S.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Filsecker, F.</au><au>Alvarez, R.</au><au>Bernet, S.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Characterization of a new 6.5 kV 1000A SiC diode for medium voltage converters</atitle><btitle>2012 IEEE Energy Conversion Congress and Exposition (ECCE)</btitle><stitle>ECCE</stitle><date>2012-09</date><risdate>2012</risdate><spage>2253</spage><epage>2260</epage><pages>2253-2260</pages><issn>2329-3721</issn><eissn>2329-3748</eissn><isbn>1467308021</isbn><isbn>9781467308021</isbn><eisbn>9781467308014</eisbn><eisbn>1467308013</eisbn><eisbn>9781467308007</eisbn><eisbn>9781467308038</eisbn><eisbn>146730803X</eisbn><eisbn>1467308005</eisbn><abstract>This paper presents a characterization of a new SiC PIN diode module for use in medium voltage converters. It has a rating of 6.5 kV and 1000 A, comparable to Si diodes available nowadays. The static behavior, switching waveforms and losses for the new diode are analyzed. The tests were carried out for currents between 50 and 1000 A. Different dc link voltages (2.4, 3.0 and 3.6 kV), junction temperatures (from -25 to 125°C) and di/dt values (0.9-2.2 kA/μs at 1 kA) were considered for the analysis. The effects and interactions of the different parameters in the device behavior are discussed.</abstract><pub>IEEE</pub><doi>10.1109/ECCE.2012.6342434</doi><tpages>8</tpages></addata></record> |
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subjects | Insulated gate bipolar transistors Junctions Semiconductor diodes Silicon carbide Switches Temperature measurement Voltage measurement |
title | Characterization of a new 6.5 kV 1000A SiC diode for medium voltage converters |
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