ESD measurement methods for carrier tape packing material for ESDS semiconductor device

ESD measurement methods for carrier tape packing material for ESDS semiconductor device

Today, it is commonly assumed that carrier tape top surface resistance is equivalent to resistance in carrier tape pockets and also that there is always continuity between pockets and tape body. This article explains why these assumptions are incorrect and an alternative method of measurement is pro...

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1. Verfasser: Shih Ming Lee
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Electrical resistance measurement
Electrostatic discharges
Immune system
Pins
Probes
Surface resistance
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description Today, it is commonly assumed that carrier tape top surface resistance is equivalent to resistance in carrier tape pockets and also that there is always continuity between pockets and tape body. This article explains why these assumptions are incorrect and an alternative method of measurement is proposed.
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identifier ISSN: 0739-5159
ispartof Electrical Overstress / Electrostatic Discharge Symposium Proceedings 2012, 2012, p.1-10
issn 0739-5159
2164-9340
language eng
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Electrical resistance measurement
Electrostatic discharges
Immune system
Pins
Probes
Surface resistance
title ESD measurement methods for carrier tape packing material for ESDS semiconductor device
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