ESD measurement methods for carrier tape packing material for ESDS semiconductor device

ESD measurement methods for carrier tape packing material for ESDS semiconductor device

Today, it is commonly assumed that carrier tape top surface resistance is equivalent to resistance in carrier tape pockets and also that there is always continuity between pockets and tape body. This article explains why these assumptions are incorrect and an alternative method of measurement is pro...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: Shih Ming Lee
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Electrical resistance measurement
Electrostatic discharges
Immune system
Pins
Probes
Surface resistance
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Beschreibung
Zusammenfassung:Today, it is commonly assumed that carrier tape top surface resistance is equivalent to resistance in carrier tape pockets and also that there is always continuity between pockets and tape body. This article explains why these assumptions are incorrect and an alternative method of measurement is proposed.
ISSN:0739-5159
2164-9340