Advanced IC technologies I

This all-Invited session covers advanced technologies, including the first production tri-gate devices, ultra-thin SOI, reliability challenges for scaled CMOS, and SiC devices for power management.

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Loke, Alvin, Sunderland, David
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	CMOS integrated circuits CMOS technology High K dielectric materials Integrated circuit reliability Silicon carbide
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	This all-Invited session covers advanced technologies, including the first production tri-gate devices, ultra-thin SOI, reliability challenges for scaled CMOS, and SiC devices for power management.
ISSN:	0886-5930 2152-3630
DOI:	10.1109/CICC.2012.6330656