Observation of heavy ion induced transients in linear circuits
Linear integrated circuits response is susceptible to be disturbed by heavy ion induced transients. The charge deposited by the ion in an amplifier stage can result in a voltage swing which may be amplified again in the following stages of the circuits. Events of this type are thought to be responsi...
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| creator | Ecoffet, R. Duzellier, S. Tastet, P. Aicardi, C. Labrunee, M. |
| description | Linear integrated circuits response is susceptible to be disturbed by heavy ion induced transients. The charge deposited by the ion in an amplifier stage can result in a voltage swing which may be amplified again in the following stages of the circuits. Events of this type are thought to be responsible for anomalies in the Earth Sensor of NASA/CNES TOPEX/POSEIDON satellite. First tests have been performed by Koga et al. (1993). In this paper, we present data which confirm Dr. Koga's findings. |
| doi_str_mv | 10.1109/REDW.1994.633038 |
| format | Conference Proceeding |
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The charge deposited by the ion in an amplifier stage can result in a voltage swing which may be amplified again in the following stages of the circuits. Events of this type are thought to be responsible for anomalies in the Earth Sensor of NASA/CNES TOPEX/POSEIDON satellite. First tests have been performed by Koga et al. (1993). In this paper, we present data which confirm Dr. Koga's findings.</abstract><pub>IEEE</pub><doi>10.1109/REDW.1994.633038</doi></addata></record> |
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| identifier | ISBN: 9780780320222 |
| ispartof | Workshop Record. 1994 IEEE Radiation Effects Data Workshop, 1994, p.72-77 |
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| language | eng |
| recordid | cdi_ieee_primary_633038 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Analog integrated circuits Circuit testing Linear circuits Operational amplifiers Oscilloscopes Power supplies Pulse amplifiers Silicon compounds System testing Voltage |
| title | Observation of heavy ion induced transients in linear circuits |
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