Observation of heavy ion induced transients in linear circuits

Observation of heavy ion induced transients in linear circuits

Linear integrated circuits response is susceptible to be disturbed by heavy ion induced transients. The charge deposited by the ion in an amplifier stage can result in a voltage swing which may be amplified again in the following stages of the circuits. Events of this type are thought to be responsi...

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Bibliographische Detailangaben
Hauptverfasser: Ecoffet, R., Duzellier, S., Tastet, P., Aicardi, C., Labrunee, M.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Analog integrated circuits
Circuit testing
Linear circuits
Operational amplifiers
Oscilloscopes
Power supplies
Pulse amplifiers
Silicon compounds
System testing
Voltage
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Zusammenfassung:Linear integrated circuits response is susceptible to be disturbed by heavy ion induced transients. The charge deposited by the ion in an amplifier stage can result in a voltage swing which may be amplified again in the following stages of the circuits. Events of this type are thought to be responsible for anomalies in the Earth Sensor of NASA/CNES TOPEX/POSEIDON satellite. First tests have been performed by Koga et al. (1993). In this paper, we present data which confirm Dr. Koga's findings.
DOI:10.1109/REDW.1994.633038