Terahertz imaging and spectroscopy of single-layer graphene embedded in dielectrics

Terahertz imaging and spectroscopy of single-layer graphene embedded in dielectrics

We study graphene/dielectric interfaces using THz imaging and spectroscopy. Non-contacting, non-destructive THz probing reveals the local sheet conductivity of single-layer graphene deposited on a Si substrate and covered by a thin PMMA layer.

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Bibliographische Detailangaben
Hauptverfasser: Paul, M. J., Tomaino, J. L., Kevek, J. W., Deborde, T. A., Thompson, Z. J., McEuen, P. L., Minot, E. D., Yun-Shik Lee
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Conductivity
Imaging
Silicon
Spectroscopy
Substrates
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Beschreibung
Zusammenfassung:We study graphene/dielectric interfaces using THz imaging and spectroscopy. Non-contacting, non-destructive THz probing reveals the local sheet conductivity of single-layer graphene deposited on a Si substrate and covered by a thin PMMA layer.
ISSN:2160-8989
2160-9004
DOI:10.1364/CLEO_SI.2012.CTu3B.1