Length determination of DNA fragments in atomic force microscope images
A processing algorithm was developed to detect and determine the lengths of DNA fragments in atomic force microscope images. The algorithm was designed to account for varying image conditions, fragment sizes, and background contamination, while minimizing the processing time to provide a high throug...
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| container_end_page | 157 vol.3 |
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| creator | Spisz, T.S. D'Costa, N. Seymour, C.K. Hoh, J.H. Reeves, R. Bankman, I.N. |
| description | A processing algorithm was developed to detect and determine the lengths of DNA fragments in atomic force microscope images. The algorithm was designed to account for varying image conditions, fragment sizes, and background contamination, while minimizing the processing time to provide a high throughput. Although a large enough sample of images has not been tested yet to determine precisely the accuracy, we estimate the accuracy to be within 2 pixels based on analysis of an ideal simulated image and an actual image. |
| doi_str_mv | 10.1109/ICIP.1997.632033 |
| format | Conference Proceeding |
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The algorithm was designed to account for varying image conditions, fragment sizes, and background contamination, while minimizing the processing time to provide a high throughput. 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The algorithm was designed to account for varying image conditions, fragment sizes, and background contamination, while minimizing the processing time to provide a high throughput. Although a large enough sample of images has not been tested yet to determine precisely the accuracy, we estimate the accuracy to be within 2 pixels based on analysis of an ideal simulated image and an actual image.</description><subject>Atomic force microscopy</subject><subject>Bioinformatics</subject><subject>Couplings</subject><subject>Diseases</subject><subject>DNA</subject><subject>Electrokinetics</subject><subject>Genetics</subject><subject>Genomics</subject><subject>Optical microscopy</subject><subject>Physics</subject><isbn>0818681837</isbn><isbn>9780818681837</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1997</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotT01LxDAUDIigrnsXT_kDrS9Nm4_jUnUtFPWg5-W1-1IjtlmSXPz3FtaBYeY0H4zdCSiFAPvQtd17KazVpZIVSHnBbsAIo1ZKfcW2KX3DClNpbdU12_e0TPmLHylTnP2C2YeFB8cfX3fcRZxmWnLifuGYw-xH7kIcia8uhjSGE3E_40Tpll06_Em0_dcN-3x--mhfiv5t37W7vvAC6lxgZcGQxnWaq1AAGVRak6TaVtg0BES1c3Y8DqCHRqCQBDjaRol6GBqt5Ybdn3M9ER1OcW2Pv4fzVfkHsshJxQ</recordid><startdate>1997</startdate><enddate>1997</enddate><creator>Spisz, T.S.</creator><creator>D'Costa, N.</creator><creator>Seymour, C.K.</creator><creator>Hoh, J.H.</creator><creator>Reeves, R.</creator><creator>Bankman, I.N.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1997</creationdate><title>Length determination of DNA fragments in atomic force microscope images</title><author>Spisz, T.S. ; D'Costa, N. ; Seymour, C.K. ; Hoh, J.H. ; Reeves, R. ; Bankman, I.N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i104t-a2908e7a320f2a10e8a677e3e492a55e0ee4ff9cdb07b51a13e0ac95614bb5773</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Atomic force microscopy</topic><topic>Bioinformatics</topic><topic>Couplings</topic><topic>Diseases</topic><topic>DNA</topic><topic>Electrokinetics</topic><topic>Genetics</topic><topic>Genomics</topic><topic>Optical microscopy</topic><topic>Physics</topic><toplevel>online_resources</toplevel><creatorcontrib>Spisz, T.S.</creatorcontrib><creatorcontrib>D'Costa, N.</creatorcontrib><creatorcontrib>Seymour, C.K.</creatorcontrib><creatorcontrib>Hoh, J.H.</creatorcontrib><creatorcontrib>Reeves, R.</creatorcontrib><creatorcontrib>Bankman, I.N.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Spisz, T.S.</au><au>D'Costa, N.</au><au>Seymour, C.K.</au><au>Hoh, J.H.</au><au>Reeves, R.</au><au>Bankman, I.N.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Length determination of DNA fragments in atomic force microscope images</atitle><btitle>Proceedings of International Conference on Image Processing</btitle><stitle>ICIP</stitle><date>1997</date><risdate>1997</risdate><volume>3</volume><spage>154</spage><epage>157 vol.3</epage><pages>154-157 vol.3</pages><isbn>0818681837</isbn><isbn>9780818681837</isbn><abstract>A processing algorithm was developed to detect and determine the lengths of DNA fragments in atomic force microscope images. The algorithm was designed to account for varying image conditions, fragment sizes, and background contamination, while minimizing the processing time to provide a high throughput. Although a large enough sample of images has not been tested yet to determine precisely the accuracy, we estimate the accuracy to be within 2 pixels based on analysis of an ideal simulated image and an actual image.</abstract><pub>IEEE</pub><doi>10.1109/ICIP.1997.632033</doi></addata></record> |
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| ispartof | Proceedings of International Conference on Image Processing, 1997, Vol.3, p.154-157 vol.3 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Atomic force microscopy Bioinformatics Couplings Diseases DNA Electrokinetics Genetics Genomics Optical microscopy Physics |
| title | Length determination of DNA fragments in atomic force microscope images |
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