Capacitor dendrite failure analysis for lidless CPU testing

Capacitor dendrite failure analysis for lidless CPU testing

One lidless CPU product failed more than 20% of visual inspections due to foreign material near the capacitor electrodes during testing production. This paper presents the analysis method for the foreign material, formation mechanism of dendrites, verification experiment by DOE, root cause for this...

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Bibliographische Detailangaben
Hauptverfasser: Weidong, Huang, Changhong, Yu, Cimi, Cui, Dolphin, Zuo, Hongwei, Guo, Chris, Xie, Majed, Anani
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Capacitors
Central Processing Unit
Electrodes
Humidity
Materials
Production
Tin
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Beschreibung
Zusammenfassung:One lidless CPU product failed more than 20% of visual inspections due to foreign material near the capacitor electrodes during testing production. This paper presents the analysis method for the foreign material, formation mechanism of dendrites, verification experiment by DOE, root cause for this case, and corrective solutions.
ISSN:1946-1542
DOI:10.1109/IPFA.2012.6306253