SIM.EM-K4 10 pF capacitance comparison summary
A key comparison of capacitance has been carried out by the Inter-American Metrology System (SIM) Regional Metrology Organization (RMO). The purpose is to establish the degree of equivalence of capacitance between the national metrology institutes (NMIs) within SIM, in support of the International C...
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| creator | Koffman, A. Zhang, N.F. Wang, Y. Shields, S. Wood, B. Kochav, K. Moreno, J.A. Sanchez, H. Castro, B.I. Cazabat, M. Ogino, L.M. Kyriazis, G. Vasconcellos, R.T.B. Slomovitz, D. Izquierdo, D. Faverio, C. |
| description | A key comparison of capacitance has been carried out by the Inter-American Metrology System (SIM) Regional Metrology Organization (RMO). The purpose is to establish the degree of equivalence of capacitance between the national metrology institutes (NMIs) within SIM, in support of the International Committee for Weights and Measures (CIPM) Mutual Recognition Agreement (MRA). The key comparison artifact is a 10 pF commercial fused-silica standard capacitor. Seven SIM NMIs participated in the comparison. Results linking the SIM.EM-K4 to CCEM-K4 will show agreement of SIM NMIs to other RMOs. |
| doi_str_mv | 10.1109/CPEM.2012.6250971 |
| format | Conference Proceeding |
| fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_6250971</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6250971</ieee_id><sourcerecordid>6250971</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-5834c51217942a9c5929a5abcfee3b956210388f7202e2ea346c6c47c1d13f23</originalsourceid><addsrcrecordid>eNo9j81KAzEURuMfOK0-gLiZF0i89-Z_KcNUix0U6r6kMQMRpx0mdeHbi7S4-hYHzuFj7A5BIIJ_aN7aThAgCUMavMUzNkNlrASl0J6zitAAB7R48Q-k15esAu08R-X0NZuV8glACkBWTKyXnWg7_qJqhHpc1DGMIeZD2MVUx_0whimX_a4u38MQpp8bdtWHr5JuTztn60X73jzz1evTsnlc8ezhwLWTKmoktF5R8FF78kGHbexTkluvDSFI53pLQIlSkMpEE5WN-IGyJzln90drTiltxin_pTeny_IXei1DHg</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>SIM.EM-K4 10 pF capacitance comparison summary</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Koffman, A. ; Zhang, N.F. ; Wang, Y. ; Shields, S. ; Wood, B. ; Kochav, K. ; Moreno, J.A. ; Sanchez, H. ; Castro, B.I. ; Cazabat, M. ; Ogino, L.M. ; Kyriazis, G. ; Vasconcellos, R.T.B. ; Slomovitz, D. ; Izquierdo, D. ; Faverio, C.</creator><creatorcontrib>Koffman, A. ; Zhang, N.F. ; Wang, Y. ; Shields, S. ; Wood, B. ; Kochav, K. ; Moreno, J.A. ; Sanchez, H. ; Castro, B.I. ; Cazabat, M. ; Ogino, L.M. ; Kyriazis, G. ; Vasconcellos, R.T.B. ; Slomovitz, D. ; Izquierdo, D. ; Faverio, C.</creatorcontrib><description>A key comparison of capacitance has been carried out by the Inter-American Metrology System (SIM) Regional Metrology Organization (RMO). The purpose is to establish the degree of equivalence of capacitance between the national metrology institutes (NMIs) within SIM, in support of the International Committee for Weights and Measures (CIPM) Mutual Recognition Agreement (MRA). The key comparison artifact is a 10 pF commercial fused-silica standard capacitor. Seven SIM NMIs participated in the comparison. Results linking the SIM.EM-K4 to CCEM-K4 will show agreement of SIM NMIs to other RMOs.</description><identifier>ISSN: 0589-1485</identifier><identifier>ISBN: 1467304395</identifier><identifier>ISBN: 9781467304399</identifier><identifier>EISSN: 2160-0171</identifier><identifier>EISBN: 1467304417</identifier><identifier>EISBN: 9781467304412</identifier><identifier>EISBN: 1467304425</identifier><identifier>EISBN: 9781467304429</identifier><identifier>DOI: 10.1109/CPEM.2012.6250971</identifier><language>eng</language><publisher>IEEE</publisher><subject>Atmospheric measurements ; Capacitance ; Capacitance measurements ; comparison linkage ; Ice ; key comparison ; measurement comparison ; NIST ; Particle measurements ; standard capacitor ; Uncertainty</subject><ispartof>2012 Conference on Precision electromagnetic Measurements, 2012, p.398-399</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6250971$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,27923,54918</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6250971$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Koffman, A.</creatorcontrib><creatorcontrib>Zhang, N.F.</creatorcontrib><creatorcontrib>Wang, Y.</creatorcontrib><creatorcontrib>Shields, S.</creatorcontrib><creatorcontrib>Wood, B.</creatorcontrib><creatorcontrib>Kochav, K.</creatorcontrib><creatorcontrib>Moreno, J.A.</creatorcontrib><creatorcontrib>Sanchez, H.</creatorcontrib><creatorcontrib>Castro, B.I.</creatorcontrib><creatorcontrib>Cazabat, M.</creatorcontrib><creatorcontrib>Ogino, L.M.</creatorcontrib><creatorcontrib>Kyriazis, G.</creatorcontrib><creatorcontrib>Vasconcellos, R.T.B.</creatorcontrib><creatorcontrib>Slomovitz, D.</creatorcontrib><creatorcontrib>Izquierdo, D.</creatorcontrib><creatorcontrib>Faverio, C.</creatorcontrib><title>SIM.EM-K4 10 pF capacitance comparison summary</title><title>2012 Conference on Precision electromagnetic Measurements</title><addtitle>CPEM</addtitle><description>A key comparison of capacitance has been carried out by the Inter-American Metrology System (SIM) Regional Metrology Organization (RMO). The purpose is to establish the degree of equivalence of capacitance between the national metrology institutes (NMIs) within SIM, in support of the International Committee for Weights and Measures (CIPM) Mutual Recognition Agreement (MRA). The key comparison artifact is a 10 pF commercial fused-silica standard capacitor. Seven SIM NMIs participated in the comparison. Results linking the SIM.EM-K4 to CCEM-K4 will show agreement of SIM NMIs to other RMOs.</description><subject>Atmospheric measurements</subject><subject>Capacitance</subject><subject>Capacitance measurements</subject><subject>comparison linkage</subject><subject>Ice</subject><subject>key comparison</subject><subject>measurement comparison</subject><subject>NIST</subject><subject>Particle measurements</subject><subject>standard capacitor</subject><subject>Uncertainty</subject><issn>0589-1485</issn><issn>2160-0171</issn><isbn>1467304395</isbn><isbn>9781467304399</isbn><isbn>1467304417</isbn><isbn>9781467304412</isbn><isbn>1467304425</isbn><isbn>9781467304429</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2012</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNo9j81KAzEURuMfOK0-gLiZF0i89-Z_KcNUix0U6r6kMQMRpx0mdeHbi7S4-hYHzuFj7A5BIIJ_aN7aThAgCUMavMUzNkNlrASl0J6zitAAB7R48Q-k15esAu08R-X0NZuV8glACkBWTKyXnWg7_qJqhHpc1DGMIeZD2MVUx_0whimX_a4u38MQpp8bdtWHr5JuTztn60X73jzz1evTsnlc8ezhwLWTKmoktF5R8FF78kGHbexTkluvDSFI53pLQIlSkMpEE5WN-IGyJzln90drTiltxin_pTeny_IXei1DHg</recordid><startdate>201207</startdate><enddate>201207</enddate><creator>Koffman, A.</creator><creator>Zhang, N.F.</creator><creator>Wang, Y.</creator><creator>Shields, S.</creator><creator>Wood, B.</creator><creator>Kochav, K.</creator><creator>Moreno, J.A.</creator><creator>Sanchez, H.</creator><creator>Castro, B.I.</creator><creator>Cazabat, M.</creator><creator>Ogino, L.M.</creator><creator>Kyriazis, G.</creator><creator>Vasconcellos, R.T.B.</creator><creator>Slomovitz, D.</creator><creator>Izquierdo, D.</creator><creator>Faverio, C.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201207</creationdate><title>SIM.EM-K4 10 pF capacitance comparison summary</title><author>Koffman, A. ; Zhang, N.F. ; Wang, Y. ; Shields, S. ; Wood, B. ; Kochav, K. ; Moreno, J.A. ; Sanchez, H. ; Castro, B.I. ; Cazabat, M. ; Ogino, L.M. ; Kyriazis, G. ; Vasconcellos, R.T.B. ; Slomovitz, D. ; Izquierdo, D. ; Faverio, C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-5834c51217942a9c5929a5abcfee3b956210388f7202e2ea346c6c47c1d13f23</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Atmospheric measurements</topic><topic>Capacitance</topic><topic>Capacitance measurements</topic><topic>comparison linkage</topic><topic>Ice</topic><topic>key comparison</topic><topic>measurement comparison</topic><topic>NIST</topic><topic>Particle measurements</topic><topic>standard capacitor</topic><topic>Uncertainty</topic><toplevel>online_resources</toplevel><creatorcontrib>Koffman, A.</creatorcontrib><creatorcontrib>Zhang, N.F.</creatorcontrib><creatorcontrib>Wang, Y.</creatorcontrib><creatorcontrib>Shields, S.</creatorcontrib><creatorcontrib>Wood, B.</creatorcontrib><creatorcontrib>Kochav, K.</creatorcontrib><creatorcontrib>Moreno, J.A.</creatorcontrib><creatorcontrib>Sanchez, H.</creatorcontrib><creatorcontrib>Castro, B.I.</creatorcontrib><creatorcontrib>Cazabat, M.</creatorcontrib><creatorcontrib>Ogino, L.M.</creatorcontrib><creatorcontrib>Kyriazis, G.</creatorcontrib><creatorcontrib>Vasconcellos, R.T.B.</creatorcontrib><creatorcontrib>Slomovitz, D.</creatorcontrib><creatorcontrib>Izquierdo, D.</creatorcontrib><creatorcontrib>Faverio, C.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Koffman, A.</au><au>Zhang, N.F.</au><au>Wang, Y.</au><au>Shields, S.</au><au>Wood, B.</au><au>Kochav, K.</au><au>Moreno, J.A.</au><au>Sanchez, H.</au><au>Castro, B.I.</au><au>Cazabat, M.</au><au>Ogino, L.M.</au><au>Kyriazis, G.</au><au>Vasconcellos, R.T.B.</au><au>Slomovitz, D.</au><au>Izquierdo, D.</au><au>Faverio, C.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>SIM.EM-K4 10 pF capacitance comparison summary</atitle><btitle>2012 Conference on Precision electromagnetic Measurements</btitle><stitle>CPEM</stitle><date>2012-07</date><risdate>2012</risdate><spage>398</spage><epage>399</epage><pages>398-399</pages><issn>0589-1485</issn><eissn>2160-0171</eissn><isbn>1467304395</isbn><isbn>9781467304399</isbn><eisbn>1467304417</eisbn><eisbn>9781467304412</eisbn><eisbn>1467304425</eisbn><eisbn>9781467304429</eisbn><abstract>A key comparison of capacitance has been carried out by the Inter-American Metrology System (SIM) Regional Metrology Organization (RMO). The purpose is to establish the degree of equivalence of capacitance between the national metrology institutes (NMIs) within SIM, in support of the International Committee for Weights and Measures (CIPM) Mutual Recognition Agreement (MRA). The key comparison artifact is a 10 pF commercial fused-silica standard capacitor. Seven SIM NMIs participated in the comparison. Results linking the SIM.EM-K4 to CCEM-K4 will show agreement of SIM NMIs to other RMOs.</abstract><pub>IEEE</pub><doi>10.1109/CPEM.2012.6250971</doi><tpages>2</tpages></addata></record> |
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| identifier | ISSN: 0589-1485 |
| ispartof | 2012 Conference on Precision electromagnetic Measurements, 2012, p.398-399 |
| issn | 0589-1485 2160-0171 |
| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Atmospheric measurements Capacitance Capacitance measurements comparison linkage Ice key comparison measurement comparison NIST Particle measurements standard capacitor Uncertainty |
| title | SIM.EM-K4 10 pF capacitance comparison summary |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T23%3A59%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=SIM.EM-K4%2010%20pF%20capacitance%20comparison%20summary&rft.btitle=2012%20Conference%20on%20Precision%20electromagnetic%20Measurements&rft.au=Koffman,%20A.&rft.date=2012-07&rft.spage=398&rft.epage=399&rft.pages=398-399&rft.issn=0589-1485&rft.eissn=2160-0171&rft.isbn=1467304395&rft.isbn_list=9781467304399&rft_id=info:doi/10.1109/CPEM.2012.6250971&rft_dat=%3Cieee_6IE%3E6250971%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&rft.eisbn=1467304417&rft.eisbn_list=9781467304412&rft.eisbn_list=1467304425&rft.eisbn_list=9781467304429&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6250971&rfr_iscdi=true |