SIM.EM-K4 10 pF capacitance comparison summary

A key comparison of capacitance has been carried out by the Inter-American Metrology System (SIM) Regional Metrology Organization (RMO). The purpose is to establish the degree of equivalence of capacitance between the national metrology institutes (NMIs) within SIM, in support of the International C...

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Hauptverfasser: Koffman, A., Zhang, N.F., Wang, Y., Shields, S., Wood, B., Kochav, K., Moreno, J.A., Sanchez, H., Castro, B.I., Cazabat, M., Ogino, L.M., Kyriazis, G., Vasconcellos, R.T.B., Slomovitz, D., Izquierdo, D., Faverio, C.
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:A key comparison of capacitance has been carried out by the Inter-American Metrology System (SIM) Regional Metrology Organization (RMO). The purpose is to establish the degree of equivalence of capacitance between the national metrology institutes (NMIs) within SIM, in support of the International Committee for Weights and Measures (CIPM) Mutual Recognition Agreement (MRA). The key comparison artifact is a 10 pF commercial fused-silica standard capacitor. Seven SIM NMIs participated in the comparison. Results linking the SIM.EM-K4 to CCEM-K4 will show agreement of SIM NMIs to other RMOs.
ISSN:0589-1485
2160-0171
DOI:10.1109/CPEM.2012.6250971