The method for evaluating the probability of failures of digital devices under the influence of short electromagnetic pulses

The method for evaluating the probability of failures of digital devices under the influence of short electromagnetic pulses

The method for evaluating the immunity of digital devices to the influence of repetitive short electromagnetic pulses is proposed. This method makes it possible to choose the optimal characteristics of radiated pulses, and to predict the results of the influence of pulses with arbitrary parameters,...

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Bibliographische Detailangaben
Hauptverfasser: Parfenov, Y. V., Radasky, W. A., Titov, B. A., Zdoukhov, L. N.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Computational modeling
Computer networks
Computers
Data models
Microstrip
Wires
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Beschreibung
Zusammenfassung:The method for evaluating the immunity of digital devices to the influence of repetitive short electromagnetic pulses is proposed. This method makes it possible to choose the optimal characteristics of radiated pulses, and to predict the results of the influence of pulses with arbitrary parameters, etc.
ISSN:2162-7673
2640-7469
DOI:10.1109/APEMC.2012.6237859