Researches of Test Nodes Selection of Analog Circuit

Researches of Test Nodes Selection of Analog Circuit

Test nodes selection of analog circuit has great significance on fast, accurate circuit diagnosis, reduce test cost. For the lack of the current test nodes selection method of analog circuit, a test nodes selection method of analog circuit based on chaos immune clone selection optimization algorithm...

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Hauptverfasser: Xu Qing-yao, Cui Shao-hui, Han Lu-jie, Deng Shi-jie
Format: Tagungsbericht
Sprache:eng
Schlagworte:
analog circuit
Analog circuits
Chaos
chaos immune clone selection algorithm
Circuit faults
Cloning
Genetic algorithms
Heuristic algorithms
Optimization
test nodes optimal selection
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Beschreibung
Zusammenfassung:Test nodes selection of analog circuit has great significance on fast, accurate circuit diagnosis, reduce test cost. For the lack of the current test nodes selection method of analog circuit, a test nodes selection method of analog circuit based on chaos immune clone selection optimization algorithm is presented in this paper. This method improves the efficiency and accuracy of test node selection. Finally the validity of this method is presented through circuit simulation.
DOI:10.1109/ICCSEE.2012.367