The use of high-energy ion synchrotron at the ITEP for SEE testing of modern electronic components

The use of high-energy ion synchrotron at the ITEP for SEE testing of modern electronic components

The possibilities of using of high-energy heavy ion synchrotron at the Institute of Theoretical and Experimental Physics, Moscow, for single event effects testing of modern electronic components are investigated. The basic problems and offered approaches to their solution are considered. The obtaine...

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Hauptverfasser: Zinchenko, V. F., Lavrentjev, K. V., Lipsky, A. K., Ulimov, V. N., Alexejev, N. N.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
high-energy ions
integrated circuit
Integrated circuits
Ion beams
Ions
Linear energy transfer
sensitive volume
Silver
single event effects
straggling
Synchrotrons
Testing
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Zusammenfassung:The possibilities of using of high-energy heavy ion synchrotron at the Institute of Theoretical and Experimental Physics, Moscow, for single event effects testing of modern electronic components are investigated. The basic problems and offered approaches to their solution are considered. The obtained experimental data are discussed.
ISSN:0379-6566
DOI:10.1109/RADECS.2011.6131457