Underground characterization and modeling of alpha-particle induced Soft-Error Rate in CMOS 65nm SRAM

This work reports a long-duration (~ 3 years) real-time underground experiment of 65 nm SRAM technology at the underground laboratory of Modane (LSM) to quantify the impact of alpha-emitter on Soft Error Rate. We developed an original and full analytical charge deposition based on non constant Linear Energy Transfer (LET) to accurately model the diffusion/collection approach. Monte-Carlo simulation results based on this new model have been confronted to experimental data to analyze the alpha-particles impact on Multiple Ship Upset.