Compendium of TID and SEE test results for various candidate spacecraft electronics

Compendium of TID and SEE test results for various candidate spacecraft electronics

We present data on the vulnerability of various candidate spacecraft electronics to total ionizing dose and heavy ion induced single event effects. Most of the tested devices are commercial integrated circuits, including Memories, Analog-to-Digital Converters and others.

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Bibliographische Detailangaben
Hauptverfasser: Malou, F., Dangla, D., Rousset, A., Guerre, F.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Component
Ions
Performance evaluation
Power supplies
Radiation
Silicon
Spacecraft
Temperature measurement
Testing
Xenon
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Beschreibung
Zusammenfassung:We present data on the vulnerability of various candidate spacecraft electronics to total ionizing dose and heavy ion induced single event effects. Most of the tested devices are commercial integrated circuits, including Memories, Analog-to-Digital Converters and others.
ISSN:0379-6566
DOI:10.1109/RADECS.2011.6131318