Derivation of Automatic Test Set for Detection of Missing Gate Faults in Reversible Circuits

Derivation of Automatic Test Set for Detection of Missing Gate Faults in Reversible Circuits

This article presents a novel technique for the generation of test set in a reversible quantum circuit. The algorithms are developed to derive the automatic test set (ATS) for the detection of all partial missing-gate faults, all single missing gate faults and multiple missing gate faults in an (n x...

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Hauptverfasser: Kole, D. K., Rahaman, H., Das, D. K., Bhattacharya, B. B.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Arrays
Benchmark testing
Bipartite graph
Circuit faults
Integrated circuit modeling
Logic gates
Missing-gate faults
quantum computing
reversible logic
testable design
universal test set
Vectors
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Beschreibung
Zusammenfassung:This article presents a novel technique for the generation of test set in a reversible quantum circuit. The algorithms are developed to derive the automatic test set (ATS) for the detection of all partial missing-gate faults, all single missing gate faults and multiple missing gate faults in an (n x n) reversible circuit implemented with k-CNOT gates. Experimental results on some benchmark circuits are also reported.
DOI:10.1109/ISED.2011.69