A Robust Solution for Embedded Memory Test and Repair

A Robust Solution for Embedded Memory Test and Repair

This paper presents a robust solution for test and repair of embedded memories. The STAR (Self-Test and Repair) Memory System solution is developed within Synopsys Design Ware allowing users to create, integrate and verify embedded memory test and repair IP in system on chips. The key components and...

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Hauptverfasser: Darbinyan, K., Harutyunyan, G., Shoukourian, S., Vardanian, V., Zorian, Y.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Algorithm design and analysis
Built-in self-test
Circuit faults
Conferences
embedded test and repair
Maintenance engineering
Manufacturing
memory BIST
SMS
System-on-a-chip
test algorithms
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Beschreibung
Zusammenfassung:This paper presents a robust solution for test and repair of embedded memories. The STAR (Self-Test and Repair) Memory System solution is developed within Synopsys Design Ware allowing users to create, integrate and verify embedded memory test and repair IP in system on chips. The key components and features of the SMS are discussed.
ISSN:1081-7735
2377-5386
DOI:10.1109/ATS.2011.98