Realisation of submicron gate MESFETs using standard optical photolithography
Submicron gate MESFETs were realised in GaAs-based structures using a shadow technique and optical photolithography. F/sub T/ of 30 and 50 GHz are obtained with 0.5 and 0.3 /spl mu/m MESFETs. 0.3 /spl mu/m MESFETs showed F/sub max/ up to 100 GHz.
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creator | Kalfane, A. Karouta, F. Heyker, H.C. Kwaspen, J.J.M. |
description | Submicron gate MESFETs were realised in GaAs-based structures using a shadow technique and optical photolithography. F/sub T/ of 30 and 50 GHz are obtained with 0.5 and 0.3 /spl mu/m MESFETs. 0.3 /spl mu/m MESFETs showed F/sub max/ up to 100 GHz. |
doi_str_mv | 10.1109/COMMAD.1996.610111 |
format | Conference Proceeding |
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F/sub T/ of 30 and 50 GHz are obtained with 0.5 and 0.3 /spl mu/m MESFETs. 0.3 /spl mu/m MESFETs showed F/sub max/ up to 100 GHz.</description><identifier>ISBN: 0780333748</identifier><identifier>ISBN: 9780780333741</identifier><identifier>DOI: 10.1109/COMMAD.1996.610111</identifier><language>eng</language><publisher>IEEE</publisher><subject>Aluminum ; Electron optics ; FETs ; Frequency ; Gallium arsenide ; Lithography ; MESFETs ; Metallization ; Optical noise ; Resists</subject><ispartof>1996 Conference on Optoelectronic and Microelectronic Materials and Devices. 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Proceedings</title><addtitle>COMMAD</addtitle><description>Submicron gate MESFETs were realised in GaAs-based structures using a shadow technique and optical photolithography. F/sub T/ of 30 and 50 GHz are obtained with 0.5 and 0.3 /spl mu/m MESFETs. 0.3 /spl mu/m MESFETs showed F/sub max/ up to 100 GHz.</description><subject>Aluminum</subject><subject>Electron optics</subject><subject>FETs</subject><subject>Frequency</subject><subject>Gallium arsenide</subject><subject>Lithography</subject><subject>MESFETs</subject><subject>Metallization</subject><subject>Optical noise</subject><subject>Resists</subject><isbn>0780333748</isbn><isbn>9780780333741</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1996</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj8tqwzAURAWl0DbND2SlH7B7ryW_lsFNHxAT6GMdrizJVnFsYymL_H0NyWyGs5gDw9gGIUaE8qU61PX2NcayzOIMARHv2BPkBQghclk8sLX3f7BEpigzeGT1l6HeeQpuHPhouT-rk2vmBVoKhte777fdj-dn74aW-0CDplnzcQquoZ5P3RjG3oVubGeausszu7fUe7O-9Yr9LvPqI9of3j-r7T5yCDJEKiWtKG0sFqUCrXJlFKIW2hRNIqGUmFitErAygUZrbBIrLFCaU5ppLEms2ObqdcaY4zS7E82X4_Ww-Afb_k32</recordid><startdate>1996</startdate><enddate>1996</enddate><creator>Kalfane, A.</creator><creator>Karouta, F.</creator><creator>Heyker, H.C.</creator><creator>Kwaspen, J.J.M.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1996</creationdate><title>Realisation of submicron gate MESFETs using standard optical photolithography</title><author>Kalfane, A. ; Karouta, F. ; Heyker, H.C. ; Kwaspen, J.J.M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i104t-b5adba5cf189b0db7beb11d3de8c2409412fdb20f420cdd1c2f3f0a57a56d19a3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Aluminum</topic><topic>Electron optics</topic><topic>FETs</topic><topic>Frequency</topic><topic>Gallium arsenide</topic><topic>Lithography</topic><topic>MESFETs</topic><topic>Metallization</topic><topic>Optical noise</topic><topic>Resists</topic><toplevel>online_resources</toplevel><creatorcontrib>Kalfane, A.</creatorcontrib><creatorcontrib>Karouta, F.</creatorcontrib><creatorcontrib>Heyker, H.C.</creatorcontrib><creatorcontrib>Kwaspen, J.J.M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kalfane, A.</au><au>Karouta, F.</au><au>Heyker, H.C.</au><au>Kwaspen, J.J.M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Realisation of submicron gate MESFETs using standard optical photolithography</atitle><btitle>1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings</btitle><stitle>COMMAD</stitle><date>1996</date><risdate>1996</risdate><spage>223</spage><epage>226</epage><pages>223-226</pages><isbn>0780333748</isbn><isbn>9780780333741</isbn><abstract>Submicron gate MESFETs were realised in GaAs-based structures using a shadow technique and optical photolithography. F/sub T/ of 30 and 50 GHz are obtained with 0.5 and 0.3 /spl mu/m MESFETs. 0.3 /spl mu/m MESFETs showed F/sub max/ up to 100 GHz.</abstract><pub>IEEE</pub><doi>10.1109/COMMAD.1996.610111</doi><tpages>4</tpages></addata></record> |
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ispartof | 1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings, 1996, p.223-226 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Aluminum Electron optics FETs Frequency Gallium arsenide Lithography MESFETs Metallization Optical noise Resists |
title | Realisation of submicron gate MESFETs using standard optical photolithography |
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