Realisation of submicron gate MESFETs using standard optical photolithography

Submicron gate MESFETs were realised in GaAs-based structures using a shadow technique and optical photolithography. F/sub T/ of 30 and 50 GHz are obtained with 0.5 and 0.3 /spl mu/m MESFETs. 0.3 /spl mu/m MESFETs showed F/sub max/ up to 100 GHz.

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Hauptverfasser: Kalfane, A., Karouta, F., Heyker, H.C., Kwaspen, J.J.M.
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Karouta, F.
Heyker, H.C.
Kwaspen, J.J.M.
description Submicron gate MESFETs were realised in GaAs-based structures using a shadow technique and optical photolithography. F/sub T/ of 30 and 50 GHz are obtained with 0.5 and 0.3 /spl mu/m MESFETs. 0.3 /spl mu/m MESFETs showed F/sub max/ up to 100 GHz.
doi_str_mv 10.1109/COMMAD.1996.610111
format Conference Proceeding
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ispartof 1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings, 1996, p.223-226
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subjects Aluminum
Electron optics
FETs
Frequency
Gallium arsenide
Lithography
MESFETs
Metallization
Optical noise
Resists
title Realisation of submicron gate MESFETs using standard optical photolithography
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