Switch based non-linear models for system level 3-D ESD simulation

Switch based non-linear models for system level 3-D ESD simulation

ESD sensitivity of components at the system level is one of the key EMC risks in hand held devices. It is often very difficult to estimate what are the causes and effects from the pass or fail type results of the system level ESD tests. Therefore, simulations are necessary. However, non-linear simul...

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Bibliographische Detailangaben
Hauptverfasser: Turunen, J., Tarvainen, T., Hekkala, A., Ihme, S., Reinvuo, T., Tamminen, P.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
computational electromagnetics
Electromagnetic compatibility
Electrostatic discharge
Integrated circuit modeling
nonlinear systems
Plastics
Solid modeling
Switches
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Beschreibung
Zusammenfassung:ESD sensitivity of components at the system level is one of the key EMC risks in hand held devices. It is often very difficult to estimate what are the causes and effects from the pass or fail type results of the system level ESD tests. Therefore, simulations are necessary. However, non-linear simulation models of materials are lacking. This paper proposes a measurement method and a related non-linear model for material ESD characterization in 3-D electromagnetic simulations.
ISSN:2325-0356