Impact of Reference Voltage on the ELDRS Characteristics of the LM4050 Shunt Voltage Reference

Two different reference voltage options (2.5V and 5.0V) of National Semiconductor's LM4050WGxxRLQV shunt voltage reference were put through Total Ionizing Dose (TID) testing at High Dose Rate (HDR) and Low Dose Rate (LDR) with different biasing conditions during irradiation and showed different...

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Bibliographische Detailangaben

Hauptverfasser:	Kruckmeyer, K., Thang Trinh, McGee, L., Kelly, A. T.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Military standards Pins Radiation effects Resistors Sensitivity Testing Transceivers
Online-Zugang:	Volltext bestellen
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