Solder bumping methods for flip chip packaging

A survey of the flip chip industry was undertaken to investigate the various solder bumping technologies reported in the literature. The methods are classified into four main deposition categories: vapor phase, liquid phase, solid phase, and electrochemical. Theoretical and empirical evaluations of...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Rinne, G.A.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 247
container_issue
container_start_page 240
container_title
container_volume
creator Rinne, G.A.
description A survey of the flip chip industry was undertaken to investigate the various solder bumping technologies reported in the literature. The methods are classified into four main deposition categories: vapor phase, liquid phase, solid phase, and electrochemical. Theoretical and empirical evaluations of these techniques, based on work at MCNC and Unitive Electronics Inc., are provided.
doi_str_mv 10.1109/ECTC.1997.606176
format Conference Proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_606176</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>606176</ieee_id><sourcerecordid>606176</sourcerecordid><originalsourceid>FETCH-LOGICAL-i172t-b2d969b272ed356a2c981bfc4e4258906f8dea98850e75aab0fff8aa2ef97e103</originalsourceid><addsrcrecordid>eNotj01Lw0AURQc_wFi7F1f5A4lvZjLz5i0l1CoUumhdl0nmTRtNTEjqwn9voMLlnsWFA1eIRwm5lEDPq3Jf5pIIcwtWor0SidKImUFlr8WS0MEcrZ1BuhEJGEuZMaDvxP00fQIUANIlIt_1beAxrX66ofk-ph2fT32Y0tiPaWybIa1Pcw2-_vLHeX8Qt9G3Ey__uRAfr6t9-ZZttuv38mWTNRLVOatUIEuVQsVBG-tVTU5WsS64UMYR2OgCe3LOAKPxvoIYo_NecSRkCXohni7ehpkPw9h0fvw9XJ7qP4iqRNM</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Solder bumping methods for flip chip packaging</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Rinne, G.A.</creator><creatorcontrib>Rinne, G.A.</creatorcontrib><description>A survey of the flip chip industry was undertaken to investigate the various solder bumping technologies reported in the literature. The methods are classified into four main deposition categories: vapor phase, liquid phase, solid phase, and electrochemical. Theoretical and empirical evaluations of these techniques, based on work at MCNC and Unitive Electronics Inc., are provided.</description><identifier>ISSN: 0569-5503</identifier><identifier>ISBN: 9780780338579</identifier><identifier>ISBN: 078033857X</identifier><identifier>EISSN: 2377-5726</identifier><identifier>DOI: 10.1109/ECTC.1997.606176</identifier><language>eng</language><publisher>IEEE</publisher><subject>Costs ; Electronics packaging ; Flip chip ; Integrated circuit interconnections ; Integrated circuit packaging ; Integrated circuit technology ; Manufacturing industries ; Resists ; Solids ; Wafer scale integration</subject><ispartof>1997 Proceedings 47th Electronic Components and Technology Conference, 1997, p.240-247</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/606176$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/606176$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Rinne, G.A.</creatorcontrib><title>Solder bumping methods for flip chip packaging</title><title>1997 Proceedings 47th Electronic Components and Technology Conference</title><addtitle>ECTC</addtitle><description>A survey of the flip chip industry was undertaken to investigate the various solder bumping technologies reported in the literature. The methods are classified into four main deposition categories: vapor phase, liquid phase, solid phase, and electrochemical. Theoretical and empirical evaluations of these techniques, based on work at MCNC and Unitive Electronics Inc., are provided.</description><subject>Costs</subject><subject>Electronics packaging</subject><subject>Flip chip</subject><subject>Integrated circuit interconnections</subject><subject>Integrated circuit packaging</subject><subject>Integrated circuit technology</subject><subject>Manufacturing industries</subject><subject>Resists</subject><subject>Solids</subject><subject>Wafer scale integration</subject><issn>0569-5503</issn><issn>2377-5726</issn><isbn>9780780338579</isbn><isbn>078033857X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1997</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj01Lw0AURQc_wFi7F1f5A4lvZjLz5i0l1CoUumhdl0nmTRtNTEjqwn9voMLlnsWFA1eIRwm5lEDPq3Jf5pIIcwtWor0SidKImUFlr8WS0MEcrZ1BuhEJGEuZMaDvxP00fQIUANIlIt_1beAxrX66ofk-ph2fT32Y0tiPaWybIa1Pcw2-_vLHeX8Qt9G3Ey__uRAfr6t9-ZZttuv38mWTNRLVOatUIEuVQsVBG-tVTU5WsS64UMYR2OgCe3LOAKPxvoIYo_NecSRkCXohni7ehpkPw9h0fvw9XJ7qP4iqRNM</recordid><startdate>1997</startdate><enddate>1997</enddate><creator>Rinne, G.A.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1997</creationdate><title>Solder bumping methods for flip chip packaging</title><author>Rinne, G.A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i172t-b2d969b272ed356a2c981bfc4e4258906f8dea98850e75aab0fff8aa2ef97e103</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Costs</topic><topic>Electronics packaging</topic><topic>Flip chip</topic><topic>Integrated circuit interconnections</topic><topic>Integrated circuit packaging</topic><topic>Integrated circuit technology</topic><topic>Manufacturing industries</topic><topic>Resists</topic><topic>Solids</topic><topic>Wafer scale integration</topic><toplevel>online_resources</toplevel><creatorcontrib>Rinne, G.A.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Rinne, G.A.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Solder bumping methods for flip chip packaging</atitle><btitle>1997 Proceedings 47th Electronic Components and Technology Conference</btitle><stitle>ECTC</stitle><date>1997</date><risdate>1997</risdate><spage>240</spage><epage>247</epage><pages>240-247</pages><issn>0569-5503</issn><eissn>2377-5726</eissn><isbn>9780780338579</isbn><isbn>078033857X</isbn><abstract>A survey of the flip chip industry was undertaken to investigate the various solder bumping technologies reported in the literature. The methods are classified into four main deposition categories: vapor phase, liquid phase, solid phase, and electrochemical. Theoretical and empirical evaluations of these techniques, based on work at MCNC and Unitive Electronics Inc., are provided.</abstract><pub>IEEE</pub><doi>10.1109/ECTC.1997.606176</doi><tpages>8</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0569-5503
ispartof 1997 Proceedings 47th Electronic Components and Technology Conference, 1997, p.240-247
issn 0569-5503
2377-5726
language eng
recordid cdi_ieee_primary_606176
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Costs
Electronics packaging
Flip chip
Integrated circuit interconnections
Integrated circuit packaging
Integrated circuit technology
Manufacturing industries
Resists
Solids
Wafer scale integration
title Solder bumping methods for flip chip packaging
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-20T08%3A51%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Solder%20bumping%20methods%20for%20flip%20chip%20packaging&rft.btitle=1997%20Proceedings%2047th%20Electronic%20Components%20and%20Technology%20Conference&rft.au=Rinne,%20G.A.&rft.date=1997&rft.spage=240&rft.epage=247&rft.pages=240-247&rft.issn=0569-5503&rft.eissn=2377-5726&rft.isbn=9780780338579&rft.isbn_list=078033857X&rft_id=info:doi/10.1109/ECTC.1997.606176&rft_dat=%3Cieee_6IE%3E606176%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=606176&rfr_iscdi=true