Solder bumping methods for flip chip packaging
A survey of the flip chip industry was undertaken to investigate the various solder bumping technologies reported in the literature. The methods are classified into four main deposition categories: vapor phase, liquid phase, solid phase, and electrochemical. Theoretical and empirical evaluations of...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Tagungsbericht |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 247 |
---|---|
container_issue | |
container_start_page | 240 |
container_title | |
container_volume | |
creator | Rinne, G.A. |
description | A survey of the flip chip industry was undertaken to investigate the various solder bumping technologies reported in the literature. The methods are classified into four main deposition categories: vapor phase, liquid phase, solid phase, and electrochemical. Theoretical and empirical evaluations of these techniques, based on work at MCNC and Unitive Electronics Inc., are provided. |
doi_str_mv | 10.1109/ECTC.1997.606176 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_606176</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>606176</ieee_id><sourcerecordid>606176</sourcerecordid><originalsourceid>FETCH-LOGICAL-i172t-b2d969b272ed356a2c981bfc4e4258906f8dea98850e75aab0fff8aa2ef97e103</originalsourceid><addsrcrecordid>eNotj01Lw0AURQc_wFi7F1f5A4lvZjLz5i0l1CoUumhdl0nmTRtNTEjqwn9voMLlnsWFA1eIRwm5lEDPq3Jf5pIIcwtWor0SidKImUFlr8WS0MEcrZ1BuhEJGEuZMaDvxP00fQIUANIlIt_1beAxrX66ofk-ph2fT32Y0tiPaWybIa1Pcw2-_vLHeX8Qt9G3Ey__uRAfr6t9-ZZttuv38mWTNRLVOatUIEuVQsVBG-tVTU5WsS64UMYR2OgCe3LOAKPxvoIYo_NecSRkCXohni7ehpkPw9h0fvw9XJ7qP4iqRNM</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Solder bumping methods for flip chip packaging</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Rinne, G.A.</creator><creatorcontrib>Rinne, G.A.</creatorcontrib><description>A survey of the flip chip industry was undertaken to investigate the various solder bumping technologies reported in the literature. The methods are classified into four main deposition categories: vapor phase, liquid phase, solid phase, and electrochemical. Theoretical and empirical evaluations of these techniques, based on work at MCNC and Unitive Electronics Inc., are provided.</description><identifier>ISSN: 0569-5503</identifier><identifier>ISBN: 9780780338579</identifier><identifier>ISBN: 078033857X</identifier><identifier>EISSN: 2377-5726</identifier><identifier>DOI: 10.1109/ECTC.1997.606176</identifier><language>eng</language><publisher>IEEE</publisher><subject>Costs ; Electronics packaging ; Flip chip ; Integrated circuit interconnections ; Integrated circuit packaging ; Integrated circuit technology ; Manufacturing industries ; Resists ; Solids ; Wafer scale integration</subject><ispartof>1997 Proceedings 47th Electronic Components and Technology Conference, 1997, p.240-247</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/606176$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/606176$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Rinne, G.A.</creatorcontrib><title>Solder bumping methods for flip chip packaging</title><title>1997 Proceedings 47th Electronic Components and Technology Conference</title><addtitle>ECTC</addtitle><description>A survey of the flip chip industry was undertaken to investigate the various solder bumping technologies reported in the literature. The methods are classified into four main deposition categories: vapor phase, liquid phase, solid phase, and electrochemical. Theoretical and empirical evaluations of these techniques, based on work at MCNC and Unitive Electronics Inc., are provided.</description><subject>Costs</subject><subject>Electronics packaging</subject><subject>Flip chip</subject><subject>Integrated circuit interconnections</subject><subject>Integrated circuit packaging</subject><subject>Integrated circuit technology</subject><subject>Manufacturing industries</subject><subject>Resists</subject><subject>Solids</subject><subject>Wafer scale integration</subject><issn>0569-5503</issn><issn>2377-5726</issn><isbn>9780780338579</isbn><isbn>078033857X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1997</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNotj01Lw0AURQc_wFi7F1f5A4lvZjLz5i0l1CoUumhdl0nmTRtNTEjqwn9voMLlnsWFA1eIRwm5lEDPq3Jf5pIIcwtWor0SidKImUFlr8WS0MEcrZ1BuhEJGEuZMaDvxP00fQIUANIlIt_1beAxrX66ofk-ph2fT32Y0tiPaWybIa1Pcw2-_vLHeX8Qt9G3Ey__uRAfr6t9-ZZttuv38mWTNRLVOatUIEuVQsVBG-tVTU5WsS64UMYR2OgCe3LOAKPxvoIYo_NecSRkCXohni7ehpkPw9h0fvw9XJ7qP4iqRNM</recordid><startdate>1997</startdate><enddate>1997</enddate><creator>Rinne, G.A.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1997</creationdate><title>Solder bumping methods for flip chip packaging</title><author>Rinne, G.A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i172t-b2d969b272ed356a2c981bfc4e4258906f8dea98850e75aab0fff8aa2ef97e103</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Costs</topic><topic>Electronics packaging</topic><topic>Flip chip</topic><topic>Integrated circuit interconnections</topic><topic>Integrated circuit packaging</topic><topic>Integrated circuit technology</topic><topic>Manufacturing industries</topic><topic>Resists</topic><topic>Solids</topic><topic>Wafer scale integration</topic><toplevel>online_resources</toplevel><creatorcontrib>Rinne, G.A.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Rinne, G.A.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Solder bumping methods for flip chip packaging</atitle><btitle>1997 Proceedings 47th Electronic Components and Technology Conference</btitle><stitle>ECTC</stitle><date>1997</date><risdate>1997</risdate><spage>240</spage><epage>247</epage><pages>240-247</pages><issn>0569-5503</issn><eissn>2377-5726</eissn><isbn>9780780338579</isbn><isbn>078033857X</isbn><abstract>A survey of the flip chip industry was undertaken to investigate the various solder bumping technologies reported in the literature. The methods are classified into four main deposition categories: vapor phase, liquid phase, solid phase, and electrochemical. Theoretical and empirical evaluations of these techniques, based on work at MCNC and Unitive Electronics Inc., are provided.</abstract><pub>IEEE</pub><doi>10.1109/ECTC.1997.606176</doi><tpages>8</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 0569-5503 |
ispartof | 1997 Proceedings 47th Electronic Components and Technology Conference, 1997, p.240-247 |
issn | 0569-5503 2377-5726 |
language | eng |
recordid | cdi_ieee_primary_606176 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Costs Electronics packaging Flip chip Integrated circuit interconnections Integrated circuit packaging Integrated circuit technology Manufacturing industries Resists Solids Wafer scale integration |
title | Solder bumping methods for flip chip packaging |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-20T08%3A51%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Solder%20bumping%20methods%20for%20flip%20chip%20packaging&rft.btitle=1997%20Proceedings%2047th%20Electronic%20Components%20and%20Technology%20Conference&rft.au=Rinne,%20G.A.&rft.date=1997&rft.spage=240&rft.epage=247&rft.pages=240-247&rft.issn=0569-5503&rft.eissn=2377-5726&rft.isbn=9780780338579&rft.isbn_list=078033857X&rft_id=info:doi/10.1109/ECTC.1997.606176&rft_dat=%3Cieee_6IE%3E606176%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=606176&rfr_iscdi=true |