Development of open architecture test systems

Next generation test system tends to be more dependent on open architecture, in order to address reusability and interoperability of test solutions. This paper provides a framework of open-architecture test systems, not only realizing the fundamental modularization and integration in a general open-...

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Hauptverfasser: Tang Diyin, Jinsong Yu, Chen Xiongzi, Wang Honglun
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:Next generation test system tends to be more dependent on open architecture, in order to address reusability and interoperability of test solutions. This paper provides a framework of open-architecture test systems, not only realizing the fundamental modularization and integration in a general open-architecture, but also reinforcing the interchangeability of TPS & instruments, as well as parallel development of test software by ATE software technologies. Basic structure, realization details, and a case study are presented in this paper to demonstrate its feasibility and prospective for a wide range of applications.
DOI:10.1109/ICEMI.2011.6037763