Diffusion stability of ultra-sharp field emitters

Diffusion stability of ultra-sharp field emitters

The tip blunting dynamic under the self-diffusion for an ellipsoidal emitter is considered. The critical curvature of ultra-sharp field emitter is found as a function of the electric field.

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Bibliographische Detailangaben
Hauptverfasser: Eremchenko, D.V., Djuzhev, N.A., Fedirko, V.A.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Atomic layer deposition
Cathodes
Chemicals
Degradation
Ellipsoids
Equations
Heating
Stability
Surface tension
Vacuum breakdown
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Beschreibung
Zusammenfassung:The tip blunting dynamic under the self-diffusion for an ellipsoidal emitter is considered. The critical curvature of ultra-sharp field emitter is found as a function of the electric field.
DOI:10.1109/IVMC.1996.601769