A true random number generator using time-dependent dielectric breakdown

A true random number generator using time-dependent dielectric breakdown

A true random number generator (tRNG) is proposed that, for the first time, uses the random physical process of time to oxide breakdown under voltage stress. Time to breakdown is repeatedly measured with a counter and serialized into a bitstream. The 1200 μm 2 tRNG, called OxiGen, was fabricated in...

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Bibliographische Detailangaben
Hauptverfasser: Liu, Nurrachman, Pinckney, N., Hanson, S., Sylvester, D., Blaauw, D.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Arrays
Electric breakdown
Generators
NIST
Radiation detectors
Stress
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Beschreibung
Zusammenfassung:A true random number generator (tRNG) is proposed that, for the first time, uses the random physical process of time to oxide breakdown under voltage stress. Time to breakdown is repeatedly measured with a counter and serialized into a bitstream. The 1200 μm 2 tRNG, called OxiGen, was fabricated in 65 nm CMOS, passes all 15 NIST randomness tests without post-processing and in a 3 month run generated sufficient bits for worst-case expected internet use while being
ISSN:2158-5601
2158-5636