The effect of doping and grain size on electrostriction in PbZr/sub 0.52/TiO/sub 0.48/O/sub 3

The electromechanical properties of undoped PbZr/sub 0.52/Ti/sub 0.48/O/sub 3/ (PZT 52/48) samples in a size range 0.7-14 /spl mu/ were studied as a function of the grain size. Internal bias fields were found to have significant effects on the dielectric and piezoelectric behavior samples. Strains f...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Sundar, V., Kim, N., Randall, C.A., Yimnirun, R., Newnham, R.E.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The electromechanical properties of undoped PbZr/sub 0.52/Ti/sub 0.48/O/sub 3/ (PZT 52/48) samples in a size range 0.7-14 /spl mu/ were studied as a function of the grain size. Internal bias fields were found to have significant effects on the dielectric and piezoelectric behavior samples. Strains from domain reorientation caused hysteresis in the strain vs. polarization curves. It was necessary to filter out these contributions in order to study the variation in Q/sub 33/, the average ceramic electrostriction coefficient, with grain size. Q/sub 33/ varied from 2.44m/sup 4//C/sup 2/ at 14 /spl mu/ to 2.04 m/sup 4//C/sup 2/ at 0.7 /spl mu/. An apparent critical size of 2.4 /spl mu/ was observed for Q/sub 33/. The suppression of the maximum dielectric constant for PZT 52/48 at the Curie Temperature may be related to the changes in grain size through the electrostrictive effects of clamping stresses.
DOI:10.1109/ISAF.1996.598180