Digital test circuit design and optimization for AC hot-carrier reliability characterization and model calibration under realistic high frequency stress conditions

This study presents one of the first comprehensive examinations of key issues in designing hot-carrier reliability test circuits that can provide realistic stress voltage waveforms, allow access to the internal device nodes, and provide insight about circuit performance sensitivity to hot-carrier damage. New insights about previous test circuit designs are presented and additional new test circuit designs demonstrated. The inherent design trade-offs that exist between realistic waveform generation and internal device accessibility are analyzed and clarified. Recommendations for optimal test-circuit design for hot-carrier reliability characterization and model calibration are proposed.