Dynamic statistical control of manufacturing test

Dynamic statistical control of manufacturing test

A method for controlling manufacturing tests in real time by statistically predicting test behavior is described. This statistical prediction is used to eliminate certain tests in sequential testing. Analytic methods for clustering tests for more efficient execution and an algorithm for predictive t...

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Veröffentlicht in:IEEE design & test of computers 1990-08, Vol.7 (4), p.39-51
Hauptverfasser: Ghosh, S.P., Grochowski, E.G.
Format: Artikel
Sprache:eng
Schlagworte:
Algorithm design and analysis
Clustering algorithms
Computer architecture
Information retrieval
Manufacturing
Microcomputers
Prediction algorithms
Relational databases
Sequential analysis
System testing
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Zusammenfassung:A method for controlling manufacturing tests in real time by statistically predicting test behavior is described. This statistical prediction is used to eliminate certain tests in sequential testing. Analytic methods for clustering tests for more efficient execution and an algorithm for predictive testing are presented. A relational database using structured-query-language system, called SQL/DB2 is proposed; its structure allows efficient retrieval of the information needed for test prediction, test clustering, and predictive testing. A test-system architecture based on personal computers is presented.< >
ISSN:0740-7475
1558-1918
DOI:10.1109/54.57913